X-Rays and Extreme Ultraviolet Radiation
Principles and Applications

Master the physics and understand the current applications of modern X-ray and EUV sources with this fully updated second edition.

David Attwood (Author), Anne Sakdinawat (Author)

9781107062894, Cambridge University Press

Hardback, published 16 February 2017

652 pages, 278 colour illus. 8 tables
25.5 x 17.6 x 3 cm, 1.37 kg

'… an exhaustive introduction … a 'must have' on the shelf of every student in experimental condensed matter physics and, more in general, of any scientist committed to synchrotron and free electron laser radiation experiments.' Erik Vesselli, Nuclear Instruments and Methods in Physics Research

With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely revised chapter on spatial and temporal coherence; and extensive discussion of the generation and applications of femtosecond and attosecond techniques. Readers will be guided step by step through the mathematics of each topic, with over 300 figures, 50 reference tables and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online. This is the 'go-to' guide for graduate students, researchers and industry practitioners interested in X-ray and EUV interaction with matter.

1. Introduction
2. Radiation and scattering at EUV and X-ray wavelengths
3. Wave propagation and refractive index at X-ray and EUV wavelengths
4. Coherence at short wavelengths
5. Synchrotron radiation
6. X-ray and EUV free electron lasers
7. Laser high harmonic generation
8. Physics of hot dense plasmas
9. Extreme ultraviolet and soft X-ray lasers
10. X-ray and extreme ultraviolet optics
11. X-ray and EUV imaging.

Subject Areas: Electronics engineering [TJF], Electronics & communications engineering [TJ], Technology, engineering, agriculture [T], Optical physics [PHJ], Mathematics & science [P]