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Scanning Nonlinear Dielectric Microscopy
Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices
The definitive reference on the methods and insights derived from a key materials characterization technique for ferroelectric materials
Yasuo Cho (Author)
9780128172469, Elsevier Science
Paperback, published 21 May 2020
256 pages, 120 illustrations (30 in full color)
22.9 x 15.1 x 1.7 cm, 0.42 kg
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.
1. Principals of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric polarization 2. Ferroelectric polarization measurement 3. Three-dimensional polarization measurement 4. Ultra high-density ferroelectric data storage using scanning nonlinear dielectric microscopy 5. Linear permittivity measurement by scanning nonlinear dielectric microscopy 6. Noncontact scanning nonlinear dielectric microscopy 7. Scanning nonlinear dielectric potentiometry for measurement of the potential induced by atomic dipole measurements 8. Principles of scanning nonlinear dielectric microscopy for semiconductor measurements 9. Carrier distribution measurement in semiconductor materials and devices 10. Super-higher-order scanning nonlinear dielectric microscopy 11. Local deep-level transient spectroscopy 12. Time-resolved scanning nonlinear dielectric microscopy
Subject Areas: Electronics & communications engineering [TJ], Materials science [TGM]
