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Reliability Investigation of LED Devices for Public Light Applications
Explores GaN technology, specifically the main failure mechanisms centered on plastic packaging, with a specific focus on the electrical and spectral model
Raphael Baillot (Author), Yannick Deshayes (Author)
9781785481499, Elsevier Science
Hardback, published 6 March 2017
222 pages
22.9 x 15.1 x 2 cm, 0.48 kg
Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved.
1. Light-emitting Diodes: State-of-the-Art GaN Technologies 2. Tools and Analysis Methods of Encapsulated LEDs 3. Failure Analysis Methodology of Blue LEDs 4. Integration of the Methodology Starting from Component Design
Subject Areas: Laser technology & holography [TTBL], Applied optics [TTB]
