Reflection Electron Microscopy and Spectroscopy for Surface Analysis

A self-contained book on electron microscopy and spectrometry techniques for surface studies.

Zhong Lin Wang (Author)

9780521017954, Cambridge University Press

Paperback, published 22 August 2005

460 pages, 224 b/w illus. 10 tables
24.4 x 17 x 2.5 cm, 0.731 kg

' … this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

1. Kinematical electron diffraction
Part I. Diffraction of Reflected Electrons: 2. Reflection high-energy electron diffraction
3. Dynamical theories of RHEED
4. Resonance reflections in RHEED
Part II. Imaging of Reflected Electrons: 5. Imaging in TEM
6. Contrast mechanisms of reflected electron imaging
7. Applications of UHV REM
8. Applications of non-UHV REM
Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED
10. Valence excitation in RHEED
11. Atomic inner-shell excitations in RHEED
12. Novel techniques associated with reflection electron imaging
Appendix A. Physical constants, electron wavelengths and wave numbers
Appendix B. Crystal inner potential and atomic scattering factor
Appendix C.1. Crystallographic structure systems
Appendix C.2. FORTRAN program for calculating crystallographic data
Appendix D. Electron diffraction patterns of several types of crystals structures
Appendix E. FORTRAN programs
Appendix F. Bibliography of REM, SREM and REELS
References.

Subject Areas: Materials science [TGM]