Nanocharacterization Techniques

A detailed study of different nanocharacterization techniques, including the mathematical foundations needed to use them effectively in nanomaterials and nanostructures

Osvaldo de Oliveira, Jr (Edited by), Ferreira L,G Marystela (Edited by), Fábio de Lima Leite (Edited by), Alessandra Luzia Da Róz (Edited by)

9780323497787, Elsevier Science

Hardback, published 23 March 2017

222 pages
23.4 x 19 x 2 cm, 0.63 kg

Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs.

1. Scanning Electron Microscopy 2. Atomic Force Microscopy: A Powerful Tool for Electrical Characterization 3. Spectroscopic Techniques for Characterization of Nanomaterials 4. Dynamic Light Scattering Applied to Nanoparticle Characterization 5. X-Ray Diffraction and Scattering by Nanomaterials 6. Surface Plasmon Resonance (SPR) for Sensors and Biosensors

Subject Areas: Materials science [TGM], Microscopy [PDND]