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Morphological Image Operators
Presents cutting-edge articles on the latest developments in all areas of microscopy, image science and related subjects in electron physics
Martin Hÿtch (Series edited by), Peter W. Hawkes (Series edited by)
9780128210031, Elsevier Science
Hardback, published 2 September 2020
520 pages
22.9 x 15.1 x 3.1 cm, 0.97 kg
Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. First principles Henk J.A.M. Heijmans 2. Complete lattices Henk J.A.M. Heijmans 3. Operators on complete lattices Henk J.A.M. Heijmans 4. Operators which are translation invariant Henk J.A.M. Heijmans 5. Adjunctions, dilations, and erosions Henk J.A.M. Heijmans 6. Openings and closings Henk J.A.M. Heijmans 7. Hit-or-miss topology and semi-continuity Henk J.A.M. Heijmans 8. Discretization Henk J.A.M. Heijmans 9. Convexity, distance, and connectivity Henk J.A.M. Heijmans 10. Lattice representations of functions Henk J.A.M. Heijmans 11. Morphology for grey-scale images Henk J.A.M. Heijmans 12. Morphological filters Henk J.A.M. Heijmans 13. Filtering and iteration Henk J.A.M. Heijmans
Subject Areas: Signal processing [UYS], Electronic devices & materials [TJFD], Mechanical engineering [TGB]
