Materials Reliability in Microelectronics III: Volume 309

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Kenneth P. Rodbell (Edited by), William F. Filter (Edited by), Harold J. Frost (Edited by), Paul S. Ho (Edited by)

9781107409484, Cambridge University Press

Paperback / softback, published 5 June 2014

514 pages
22.9 x 15.2 x 2.6 cm, 0.68 kg

Subject Areas: Materials science [TGM]