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Defects in Semiconductors
A reference book in semiconductor physics and engineering, with each chapter reviewing a specific type of semiconductor defect
Lucia Romano (Volume editor), Vittorio Privitera (Volume editor), Chennupati Jagadish (Volume editor)
9780128019351
Hardback, published 26 May 2015
458 pages
22.9 x 15.1 x 2.8 cm, 0.81 kg
This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields. The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths.
Peter Pichler Arne Nylandsted Larsen and Abdelmadjid Mesli Enrico Napolitani and Giuliana Impellizzeri Nicholas G. Rudawski, Aaron G. Lind and Thomas P. Martin Mangalampalli S. R. N. Kiran, Bianca Haberl, Jodie E. Bradby and James S. Williams Eddy Simoen, Johan Lauwaert and Henk Vrielinck Daniela Cavalcoli, Beatrice Fraboni and Anna Cavallini Matthew D. McCluskey Michael A. Reshchikov
Subject Areas: Electronic devices & materials [TJFD], Electronics & communications engineering [TJ], Materials science [TGM]
