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Atom Probe Tomography
Put Theory Into Practice
This indispensable reference provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials, including how to prepare specimens, set up the appropriate conditions for tomography, analyze data, and work with other tools to create the most accurate results
Williams Lefebvre (Edited by), Francois Vurpillot (Edited by), Xavier Sauvage (Edited by)
9780128046470
Hardback, published 2 June 2016
416 pages
22.9 x 15.1 x 2.7 cm, 0.77 kg
"This book provides a combination of fundamental theory and practical information on atom probe techniques. This book can be used by both beginners and experienced researchers wanting to expand their knowledge in the area of atom probe tomogrophy. While providing the background and necessary fundamentals for the beginner to understand instrumentation, sample preparation, and the expected results that can be obtained, the advanced researcher will benefit from the wealth of information, including tables, references, and techniques found in a single resource." --IEEE Electrical Insulation Magazine "The combination of theory and practical methods presented in this book make it a very useful resource for the new or seasoned surface scientist." --IEEE Electrical Insulation Magazine
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process.
Introduction Chapter 1. Atom Probe Fundamentals Chapter 2. Field Ion Emission Mechanisms Chapter 3. Field Ion Microscopy Chapter 4. Specimen Preparation by Focused Ion Beam Chapter 5. Time of Flight Mass Spectrometry and Composition Measurements Chapter 6. Atom Probe Tomography Detectors Chapter 7. 3D Reconstructions Chapter 8. Laser Assisted Field Evaporation Chapter 9. Data Mining Chapter 10. Correlative Microscopy by APT and (S)TEM Chapter 11. Combining APT and Spectroscopy Conclusion Appendix Index
Subject Areas: Physical chemistry [PNR], Spectrum analysis, spectrochemistry, mass spectrometry [PNFS]
