Advances in Materials Problem Solving with the Electron Microscope: Volume 589

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Jim Bentley (Edited by), Charles Allen (Edited by), Uli Dahmen (Edited by), Ivan Petrov (Edited by)

9781107413351, Cambridge University Press

Paperback / softback, published 5 June 2014

426 pages
22.9 x 15.2 x 2.2 cm, 0.57 kg

This book was motivated by the remarkable advances that continue to be made in electron microscope instrumentation and techniques for applications to materials science. Advances include quantitative high-resolution imaging, atomic-resolution Z-contrast imaging, elemental mapping by energy-filtered TEM or spectrum imaging, atomic resolution EELS for composition and bonding, quantitative CBED, site- occupancy determination by ALCHEMI, electron holography, EBSP in the SEM for phase identification and orientation imaging microscopy, low-voltage microanalysis of bulk specimens, and in situ experiments of dynamic phenomena. The book emphasizes how these recent developments in electron microscopy are being used to solve materials problems. It features different groups of materials or microstructural components rather than electron microscope techniques or instrumentation. Papers focus on low-energy electron microscopy of surfaces, crystallography, defects, specimen preparation, and interfaces in metals and ceramics. Technological applications include magnetic materials, microelectronic materials, partially ordered and nanophase materials, polymers, ceramics, metallic alloys, concrete, biomaterials, and glasses.

Subject Areas: Materials science [TGM], Nanotechnology [TBN]