• Advances in Imaging and Electron Physics; Theory of Intense Beams of Charged Particles (Hardback) 9780123813107
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Advances in Imaging and Electron Physics
Theory of Intense Beams of Charged Particles

Peter W. Hawkes (Series edited by)

9780123813107, Elsevier Science

Hardback, published 28 July 2011

752 pages
22.9 x 15.1 x 3.9 cm, 1.11 kg

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  1. Beam equations

  2. Exact solutions to the beam equations

  3. Anti-paraxial expansions

  4. Solution of the beam formation problem in 3D case

  5. Asymptotic theory of 3D flows

  6. Geometrized theory

  7. Examples of applications

Subject Areas: Imaging systems & technology [TTBM], Applied optics [TTB], Electronics & communications engineering [TJ]
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