Advances in Imaging and Electron Physics
Silicon-Based Millimetre-wave Technology

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

Jamal Deen (Volume editor)

9780123942982

Hardback, published 31 December 2012

484 pages
22.9 x 15.1 x 2.9 cm, 0.76 kg

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Measurement Techniques and Practical Issues

Jamal Deen

2. Transmission lines and passive components

Guennadi A. Kouzaev

3. Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping

Mohamed Bakr

4. Field-effect types of transistors

Benjamin Iniguez

5. RF MEMS Switches and Switch Matrices

Mojgan Daneshmand

6. Substrate-Integrated Antennas on Silicon

Subject Areas: Computer science [UY], Electronic devices & materials [TJFD], Electronics engineering [TJF], Materials science [TGM], Mechanical engineering [TGB]