Advances in Imaging and Electron Physics
Part A

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

Jay Theodore Cremer, Jr. (Volume editor)

9780123944221

Hardback, published 8 August 2012

696 pages
22.9 x 15.1 x 3.7 cm, 0.98 kg

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

1. Introduction to Neutron and X-ray Optics

Jay Theodore Cremer

2. Compound Refractive Lenses and Prisms

Jay Theodore Cremer

3. Geometric Neutron and X-ray Optics – Aberrations

Jay Theodore Cremer

4. X-ray Optics

Jay Theodore Cremer

5. Neutron Optics

Jay Theodore Cremer

6. X-ray and Neutron Optics

Jay Theodore Cremer

Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Applied optics [TTB], Optical physics [PHJ]