Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers

Peter W. Hawkes (Series edited by)

9780123859839, Elsevier Science

Hardback, published 27 September 2011

392 pages
22.9 x 15.1 x 2.6 cm, 0.68 kg

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach

LucaGeretti, AntonioAbramo

2. Logarithmic Image Processing for Color Images

M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

3. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography

Rainer A. Leitgeb

4. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy

S.A. Nepijko, G. Schönhense

5. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging

Chad M. Parish

6. Aberration Correctors developed under Triple C Project

Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

7. Spatially resolved thermoluminescence in a scanning electron microscope

Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Applied optics [TTB], Electronics & communications engineering [TJ], Materials science [TGM], Applied physics [PHV], Electricity, electromagnetism & magnetism [PHK]