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Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Peter W. Hawkes (Series edited by)
9780123813183, Elsevier Science
Hardback, published 18 May 2010
304 pages
22.9 x 15.1 x 2.3 cm, 0.54 kg
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. Charged particles in electromagnetic fields2. Language of aberration expansions in charged particle optics3. Transporting charged particle beams in static fields4. Transporting charged particles in radiofrequency fields5. Static magnetic charged particle analyzers6. Electrostatic energy analyzers7. Mass analyzers with combined electrostatic and magnetic fields8. Time-of-flight mass analyzers9. Radiofrequency mass analyzers
Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Laser technology & holography [TTBL], Applied optics [TTB], Materials science [TGM], Mechanical engineering [TGB], Applied physics [PHV], Electricity, electromagnetism & magnetism [PHK]
