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Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Peter W. Hawkes (Series edited by)
9780123813169, Elsevier Science
Hardback, published 6 August 2010
296 pages
22.9 x 15.1 x 2.3 cm, 0.53 kg
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. Energy Filtered X-ray Photoemission electronmicroscopy(EXPEEM)- Kiyotaka Asakura 2. Image contrast in aberration-corrected scanningconfocal electron microscopy- E.C. Cosgriff 3. Comparison of color demosaicing methods- O. Lossona 4. New dimensions for field emission: effects of structure in the emitting surface- C. J. Edgcombe 5. Conductivity Imaging and Generalised RadonTransform: a review- Archontis Giannakidis 6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy- A. Sever Škapin
Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Laser technology & holography [TTBL], Applied optics [TTB], Electronic devices & materials [TJFD], Applied physics [PHV], Electricity, electromagnetism & magnetism [PHK]
