Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers

Peter W. Hawkes (Series edited by)

9780123747686, Elsevier Science

Hardback, published 3 November 2009

373 pages
22.9 x 15.1 x 2.6 cm, 0.67 kg

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Charged particles in electromagnetic fields
2. Language of aberration expansions in charged particle optics
3. Transporting charged particle beams in static fields
4. Transporting charged particles in radiofrequency fields
5. Static magnetic charged particle analyzers
6. Electrostatic energy analyzers
7. Mass analyzers with combined electrostatic and magnetic fields
8. Time-of-flight mass analyzers
9. Radiofrequency mass analyzers

Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Applied optics [TTB], Electronic devices & materials [TJFD], Electronics & communications engineering [TJ], Applied physics [PHV], Electricity, electromagnetism & magnetism [PHK]