Advances in Imaging and Electron Physics Including Proceedings CPO-10

Presents cutting-edge articles on the latest developments in all areas of microscopy, image science and related subjects in electron physics

Peter W. Hawkes (Series edited by), Martin Hÿtch (Series edited by)

9780128174753, Elsevier Science

Hardback, published 15 October 2019

376 pages
22.9 x 15.1 x 2.6 cm, 0.7 kg

Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Part I. Papers from the Tenth International Conference on Charged Particle Optics 1. Planar multi-reflecting time-of-flight mass-spectrometer of a simple design Seitkerim B. Bimurzaev 2. Generalization of paraxial trajectory method for the analysis of non-paraxial rays Shin Fujita 3. Test and characterization of a new post-column imaging energy filter Frank Kahl, Volker Gerheim, Martin Linck, Heiko Müller, Richard Schillinger, Stephan Uhlemann 4. Electron optics for a multi-pass transmission electron microscope Marian Mankos, Stewart A. Koppell, Brannon B. Klopfer, Thomas Juffmann, Vladimir Kolarik, Khashayar Shadman, Mark Kasevich 5. A simulation program for electron mirrors using Boundary Element Method Eric Munro, Haoning Liu, Catherine Rouse, John Rouse 6. An algorithm for simulating the geometric optics of charged particle instruments Khashayar Shadman

Subject Areas: Signal processing [UYS], Electronic devices & materials [TJFD], Mechanical engineering [TGB]