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Advances in Imaging and Electron Physics
Presents cutting-edge articles on the latest developments in all areas of microscopy, image science and related subjects in electron physics
Peter W. Hawkes (Edited by), Martin Hÿtch (Edited by)
9780443193262, Elsevier Science
Hardback, published 27 March 2023
284 pages
22.9 x 15.1 x 2.2 cm, 0.59 kg
Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Preface 1. Novel theory of the structure of elementary particles H. Rose 2. Electron diffractive optics based on the magnetic Aharonov-Bohm effect Román Castañeda, Pablo Bedoya-Ríos and Giorgio Matteucci 3. Electronic image recording in conventional electron microscopy K.-H. Herrmann and D. Krahl 4. The phase problem in electron microscopy D. L. Misell
Subject Areas: Signal processing [UYS], Electronic devices & materials [TJFD], Mechanical engineering [TGB]
