Advances in Imaging and Electron Physics

Presents cutting-edge articles on the latest developments in all areas of microscopy, image science and related subjects in electron physics

Martin Hÿtch (Series edited by), Peter W. Hawkes (Series edited by)

9780128246122, Elsevier Science

Hardback, published 27 August 2021

340 pages
22.9 x 15.2 x 2.4 cm, 0.7 kg

Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Preface Martin Hÿtch and Peter W. Hawkes 1. Introduction to strain characterization method in transmission electron microscopy Alexandre Pofelski? 2. Moiré sampling in scanning transmission electron microscopy Alexandre Pofelski? 3. Scanning transmission electron microscopy moiré sampling geometrical phase analysis (STEM moiré GPA) Alexandre Pofelski? 4. Performance of scanning transmission electron microscopy moiré sampling geometrical phase analysis Alexandre Pofelski? 5. Applications of scanning transmission electron microscopy moiré sampling geometrical phase analysis Alexandre Pofelski? 6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail 7. Superconducting electron lenses David Hardy 8. Lorentz microscopy or electron phase microscopy of magnetic objects Richard Harry Wade

Subject Areas: Signal processing [UYS], Electronic devices & materials [TJFD], Mechanical engineering [TGB]