Advances in Imaging and Electron Physics

Presents cutting-edge articles on the latest developments in all areas of microscopy, image science, and related subjects in electron physics

Peter W. Hawkes (Series edited by), Martin Hÿtch (Series edited by)

9780128174692, Elsevier Science

Hardback, published 12 July 2019

320 pages
22.9 x 15.1 x 2.4 cm, 0.66 kg

Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

1. Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons Stephan Majert and Helmut Kohl 2. Reviewing the revised International System of Units (SI) Joaquín Valdés 3. Electron energy loss spectroscopy in the electron microscope Christian Colliex

Subject Areas: Signal processing [UYS], Electronic devices & materials [TJFD], Mechanical engineering [TGB]