Advances in Imaging and Electron Physics

Presents cutting-edge articles on the latest developments in all areas of microscopy, image science, and related subjects in electron physics

Peter W. Hawkes (Edited by)

9780128171837

Hardback, published 11 May 2019

376 pages
22.9 x 15.1 x 2.6 cm, 0.72 kg

Advances in Imaging and Electron Physics, Volume 210, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Sections in this new release cover Electron energy loss spectroscopy at high energy losses, Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for use in Electronic Transport Devices, and more.

1. Introduction to the Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for Use in Electronic Transport Devices Clifford M. Krowne 2. Determination of Reciprocal Lattice from Direct Space in 3D and 2D Clifford M. Krowne 3. Tight-Binding Formulation of Electronic Band Structure of Hexagonal Materials Clifford M. Krowne 4. Evaluation of the Matrix Elements for the Tight-Binding Formulation of Hexagonal Materials Clifford M. Krowne 5. Solving the Secular Equation of the System for Eigenenergy Clifford M. Krowne 6. Properties of the Bare Shifted Eigenenergy Determined as a Function of k Vector Clifford M. Krowne 7. Hamiltonian of the Two Atom Sublattice System Clifford M. Krowne 8. 2-Spinor and 4-Spinor Wavefunctions and Hamiltonians Clifford M. Krowne 9. Examination of the Relativistic Dirac Equation and Its Implications Clifford M. Krowne 10. Different Onsite Energies for the Two Atom Problem Clifford M. Krowne 11. Overall Conclusion Clifford M. Krowne 12. Performing EELS at Higher Energy Losses at Both 80 and 200 kV Ian MacLaren, Rebecca B. Cummings, Fraser Gordon, Enrique Frutos-Myro, Sam McFadzean, Andy Brown, and Alan Craven

Subject Areas: Signal processing [UYS], Electronic devices & materials [TJFD], Mechanical engineering [TGB]