Advances in Imaging and Electron Physics

Cutting-edge articles on the latest developments in all areas of microscopy, image science, and many related subjects in electron physics

Peter W. Hawkes (Series edited by)

9780128120910

Hardback, published 20 March 2017

324 pages
22.9 x 15.1 x 2.4 cm, 0.66 kg

Advances in Imaging and Electron Physics, Volume 199, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices). Specific topics include discussions on Micro-XRF in scanning electron microscopes, and an interesting take on the variational approach for simulation of equilibrium ion distributions in ion traps regarding Coulomb interaction, amongst others. Users will find a comprehensive resource on the most important aspects of particle optics at high and low energies, microlithography, image science and digital image processing.

1. Micro-XRF in Scanning Electron MicroscopesM. Haschke and S. Boehm2. A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps with Regard to Coulomb InteractionI.A. Kopaev, D. Grinfeld, M.A. Monastyrskiy, R.S. Ablizen, S.S. Alimpiev and A.A. Trubitsyn3. Analytical Review of Direct STEM Imaging Techniques for Thin SamplesI. Lazic and E.G.T. Bosch4. Quantum Nano-Optics in the Electron MicroscopeL.H.G. Tizei and M. Kociak5. Component Identification and Interpretation: A Perspective on Tower of KnowledgeM. Xu, J. Ren and Z. Wang

Subject Areas: Atomic & molecular physics [PHM], Microscopy [PDND]