Advances in Imaging and Electron Physics

Presents cutting-edge articles on the latest developments in all areas of microscopy, image science, and many related subjects in electron physics

Peter W. Hawkes (Series edited by)

9780128120866, Elsevier Science

Hardback, published 24 October 2017

248 pages
22.9 x 15.1 x 2.1 cm, 0.57 kg

Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. New physical principle for interference of light and material particles Roman Castaneda and Giorgio Matteucci 2. A Review of Scanning Electron Microscopy in Near Field Emission Mode Taryl L. Kirk 3. Nonscalar Mathematical Morphology Jasper van de Gronde and Jos B.T.M. Roerdink 4. Energy Analysing and Energy Selecting Electron Microscopes A.J.F. Metherel

Subject Areas: Electronics engineering [TJF], Mechanical engineering [TGB]