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Advances in Imaging and Electron Physics

Merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy, and features cutting-edge articles on recent developments in all areas of microscopy, image science, and many related subjects in electron physics

Peter W. Hawkes (Series edited by)

9780128048153

Hardback, published 2 February 2016

154 pages
22.9 x 15.1 x 1.8 cm, 0.43 kg

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Utilizing the Eigen-Emittance Concept for Bright Electron BeamsLeanne D. Duffy and Alex J. Dragt2. Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spectrometers Igor Spivak-Lavrov

Subject Areas: Atomic & molecular physics [PHM], Microscopy [PDND]

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