Advances in Imaging and Electron Physics

The Advances in Imaging and Electron Physics series publishes a broad collection of survey articles on topics including image-forming instruments, especially electron and near-field microscopes, imaging theory, and image processing, including mathematical morphology and many related topics in electron physics

Peter W. Hawkes (Author)

9780128048122

Hardback, published 26 September 2016

358 pages
22.9 x 15.1 x 2.5 cm, 0.77 kg

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Quantum Entanglement in Photon-Induced Electron Spectroscopy of Atoms and Molecules: Its Generation, Characterization, and Applications2. Voltage Contrast Modes in a Scanning Electron Microscope and Their Application3. A Review of Scanning Electron Microscopy in Near Field Emission Mode

Subject Areas: Atomic & molecular physics [PHM], Microscopy [PDND]