Advances in Imaging and Electron Physics

Features cutting-edge articles on recent developments in all areas of microscopy, image science and many related subjects in electron physics

Peter W. Hawkes (Series edited by)

9780128023808

Hardback, published 5 June 2015

260 pages
22.9 x 15.1 x 2.2 cm, 0.57 kg

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. CISCEM 2014 Niels de Jonge
2. Progress and Development of Direct Detectors for Cryo-Electron MicroscopyA. R. Faruqi, Richard Henderson, and Greg McMullan
3. Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement Peter W. Hawkes
4. Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the NanoscaleGrzegorz Wielgoszewski and Teodor Gotszalk

Subject Areas: Image processing [UYT], Electronic devices & materials [TJFD], Electronics & communications engineering [TJ]