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Advances in Imaging and Electron Physics
Features cutting-edge articles on recent developments in all areas of microscopy, image science and many related subjects in electron physics
Peter W. Hawkes (Series edited by)
9780128022559
Hardback, published 18 February 2015
150 pages
22.9 x 15.1 x 1.8 cm, 0.41 kg
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Electronics engineering [TJF], Particle & high-energy physics [PHP], Optical physics [PHJ]