Advances in Imaging and Electron Physics

Features cutting-edge articles on recent developments in all areas of microscopy, image science and many related subjects in electron physics

Peter W. Hawkes (Series edited by)

9780128022542

Hardback, published 15 April 2015

232 pages
22.9 x 15.1 x 2.1 cm, 0.52 kg

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Pattern Generators for Reflective Electron-Beam Lithography (REBL)Allen M. Carroll
2. Recent Developments in Time-of-Flight Mass SpectrometryFrank Gunzer and Jürgen Grotemeyer
3. A Special Voice Transform, Analytic Wavelets, and Zernike FunctionsMargit Pap
4. The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and ImagingColin Sheppard

Subject Areas: Atomic & molecular physics [PHM], Microscopy [PDND]