Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

Peter W. Hawkes (Series edited by)

9780123943965

Hardback, published 20 March 2012

280 pages
22.9 x 15.1 x 2.2 cm, 0.52 kg

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Precession Electron Diffraction A. S. Eggeman and P. A. Midgley
2. Scanning Helium Ion Microscopy R. Hill, J. A. Notte, and L. Scipioni
3. Signal reconstruction algorithm based on a single intensity in the Fresnel domain Hone-Ene Hwang, Pin Han
4. Electron Microscopy Studies on Magnetic L1₀ FePd Nanoparticles Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
5. Fundamental aspects of Near Field Emission Scanning Electron Microscopy D. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis

Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Applied optics [TTB], Applied physics [PHV]