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Advances in Imaging and Electron Physics
Peter W. Hawkes (Series edited by)
9780123859853, Elsevier Science
Hardback, published 25 August 2011
360 pages
22.9 x 15.1 x 2.5 cm, 0.62 kg
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Emmanuel de Chambost Johan Debayle, Jean-Charles Pinoli M. Ben Haj Rhouma, M.A. Khabou, L. Hermi Nicolas Lomenie, Georges Stamon Leonid P. Yaroslavsky
Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Applied optics [TTB], Electronic devices & materials [TJFD], Electronics & communications engineering [TJ], Applied physics [PHV], Electricity, electromagnetism & magnetism [PHK]