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Advances in Imaging and Electron Physics
Peter W. Hawkes (Series edited by)
9780123858610, Elsevier Science
Hardback, published 29 March 2011
360 pages
22.9 x 15.1 x 2.5 cm, 0.63 kg
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. 2D Fourier Transforms in Polar CoordinatesNatalie Baddour2. Superluminal, subluminal, and negative velocities in free-space electromagnetic propagationNeil V. Budko3. Chromatic aberration correction - the next step in electron microscopyRowan Leary and Rik Brydson4. Methods for vectorial analysis and imaging in high-resolution laser microscopy Michele Marrocco5. Image Hierarchy in Gaussian Scale SpaceTomoya Sakai1, Masaki Narita, Takuto, Komazaki, Haruhiko Nishiguchi, Atsushi Imiya6. The Theory of the Boundary Diffraction WaveYusuf Ziya Umul7. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-ray Di_raction MeasurementsEmil Wolf
Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Laser technology & holography [TTBL], Applied optics [TTB], Electronics & communications engineering [TJ], Applied physics [PHV], Electricity, electromagnetism & magnetism [PHK]
