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Advances in Imaging and Electron Physics
Peter W. Hawkes (Series edited by)
9780123810175, Elsevier Science
Hardback, published 19 April 2010
320 pages
22.9 x 15.1 x 2.4 cm, 0.55 kg
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. Gamut Mapping - Zofia Baranczuk, Joachim Giesen, Klaus Simon, Peter Zolliker2. Color Area Morphology Scale-Spaces- Adrian N.Evans3. Harmonic Holography- Ye Pu, Chia-Lung Hsieh, Rachel Grange, Demetri Psaltis4.Lattice Algebra Approach to Endmember Determination in Hyperspectral Imagery- Gerhard X. Ritter, Gonzalo Urcid5. Origin And Background Of The Invention Of The Electron Microscope- Reinhold Rudenberg6. Origin and Background of the Invention of the Electron Microscope: Commentary and Expanded Notes on Memoir of Reinhold Rudenberg- H. Gunther Rudenberg, Paul G. Rudenberg
Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Applied optics [TTB], Electronics & communications engineering [TJ], Materials science [TGM], Applied physics [PHV], Electricity, electromagnetism & magnetism [PHK]