Advances in Imaging and Electron Physics

Peter W. Hawkes (Edited by)

9780123747624, Elsevier Science

Hardback, published 4 March 2009

376 pages
22.9 x 15.1 x 2.6 cm, 0.72 kg

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1.Photometric Stereo: an overview, M. Petrou, A. Vasileios
2. The Fourier Transform in Clifford Analysis, F. Brackx, N. De Schepper, F. Sommen
3. Carbon nanotube electron sources for electron microscopes, N. de Jonge
4. Localized Waves: A Review, E. Recami, M. Zamboni-Rached

Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Applied optics [TTB], Electronics & communications engineering [TJ], Materials science [TGM], Applied physics [PHV], Electricity, electromagnetism & magnetism [PHK]