Advances in Imaging and Electron Physics

Peter W. Hawkes (Series edited by)

9780123742193, Elsevier Science

Hardback, published 12 September 2008

376 pages, Approx. 130 illustrations
22.9 x 15.1 x 2.6 cm, 0.81 kg

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Complex-valued neural network and complex-valued BP, by T. Nitta'Disorder', structured diffuse scattering and local crystal chemistry, by R.L. WithersNonlinear systems for image processing, by S. Morfu et al.The Foldy-Wouthuysen transformation technique in optics, by S.A. KhanStack filters: from definition to design algorithms, by N. HirataBlind source separation: the sparsity revolution, by J-L. Sparck et al.

Subject Areas: Signal processing [UYS], Imaging systems & technology [TTBM], Laser technology & holography [TTBL], Applied optics [TTB], Electronic devices & materials [TJFD], Electronics engineering [TJF], Electronics & communications engineering [TJ], Materials science [TGM], Electricity, electromagnetism & magnetism [PHK]