Advances in Imaging and Electron Physics

Peter W. Hawkes (Series edited by)

9780123742186, Elsevier Science

Hardback, published 3 June 2008

440 pages, Illustrated
22.9 x 15.1 x 2.8 cm, 0.87 kg

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. An important feature of these Advances is that the subjects are written in such a way that they can be understood by readers from other specialities.

Bontus & Köhler: Reconstruction Algorithms for Computed TomographyBusin, Vandenbroucke & Macaire: Color spaces and image segmentationEasley & Colonna: Generalized discrete Radon transforms and applications to image processing Radlicka: Lie algebraic methods in charged particle opticsRandle: Recent developments in electron backscatter diffraction

Subject Areas: Image processing [UYT], Signal processing [UYS], Laser technology & holography [TTBL], Applied optics [TTB], Electronics engineering [TJF], Electronics & communications engineering [TJ], Materials science [TGM], Electricity, electromagnetism & magnetism [PHK]