Advances in Imaging and Electron Physics

Peter W. Hawkes (Author)

9780120147861, Elsevier Science

Hardback, published 12 October 2006

344 pages, Approx. 200 illustrations
22.9 x 15.1 x 2.4 cm, 0.66 kg

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. Recent Progress of High Frequency Electron Cyclotron Resonance Ion Sources (HITZ)2. Fixed Points of Lattice Transforms and Lattice Associative Memories (RITTER and GADER) 3. An Extension of Mathematical Morphology to Complex Signals (RIVEST)4. Ranking Metrics and Evaluation Measures (TIAN and SEBE)

Subject Areas: Laser technology & holography [TTBL], Applied optics [TTB], Electronic devices & materials [TJFD], Electronics engineering [TJF], Electronics & communications engineering [TJ], Materials science [TGM]