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Advances in Imaging and Electron Physics
Peter W. Hawkes (Edited by)
9780120147694, Elsevier Science
Hardback, published 4 September 2003
407 pages
22.9 x 15.1 x 2.7 cm, 0.68 kg
The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
Scanning Nonlinear Dielectric Microscopy
High Order Accurate Methods in Time-Domain Computational Electromagnetics
Pre filtering for Pattern Recognition Using Wavelet Transform and Neural Networks
Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as source Material.
Subject Areas: Applied optics [TTB], Electronic devices & materials [TJFD], Electronics & communications engineering [TJ], Materials science [TGM], Mechanical engineering [TGB], Mechanical engineering & materials [TG], Atomic & molecular physics [PHM]
