Advances in Imaging and Electron Physics

Peter W. Hawkes (Edited by)

9780120147649, Elsevier Science

Hardback, published 24 July 2002

352 pages
22.9 x 15.1 x 2.5 cm, 0.61 kg

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Subject Areas: Applied optics [TTB], Electronics & communications engineering [TJ]