Advances in Imaging and Electron Physics
Aberration-corrected Electron Microscopy

Peter W. Hawkes (Series edited by)

9780123742209, Elsevier Science

Hardback, published 18 December 2008

590 pages
22.9 x 15.1 x 3.3 cm, 1.04 kg

The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth.

History of aberration correction in electron microscopy (H. Rose)Present and future hexapole aberration correctors for high resolution electron microscopy (M. Haider)Aberration correction and STEM (O.L. Krivanek)First results using the Nion third order STEM corrector (P. Batson) STEM and EELS: Mapping materials atom by atom (A.B. Bleloch) Aberration correction with the SACTEM-Toulouse: from imaging to diffraction (F. Houdellier et al.) Novel aberration corrections concepts (B. Kabius) Aberration corrected imaging in CTEM and STEM (A. Kirkland et al.)Materials applications of aberration-corrected STEM (S.J. Pennycook et al.)Spherical aberration corrected transmission electron microscopy for nanomaterials in Japan (N. Tanaka)Atomic-resolution aberration-corrected transmission electron microscopy (K. Urban et al.) Aberration-corrected electron microscopes at Brookhaven National Laboratory (Y. Zhu and J. Wall)

Subject Areas: Signal processing [UYS], Laser technology & holography [TTBL], Applied optics [TTB], Electronics & communications engineering [TJ], Materials science [TGM], Electricity, electromagnetism & magnetism [PHK]