Advanced Laser Diode Reliability

Defines Failure Physics of Semiconductor Laser Diodes: modes and mechanisms. Device-level modelling for parameter extraction and measurement new protocols

Massimo Vanzi (Author), Laurent Bechou (Author), Mitsuo Fukuda (Author), Giovanna Mura (Author)

9781785481543, Elsevier Science

Hardback, published 13 July 2021

268 pages
22.9 x 15.2 x 2.2 cm, 1 kg

Advanced Laser Diode Reliability focuses on causes and effects of  degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.

1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols

Subject Areas: Electronic devices & materials [TJFD], Electronics engineering [TJF], Electronics & communications engineering [TJ]