Aberration Theory in Electron and Ion Optics

Presents cutting-edge articles on the latest developments in all areas of microscopy, image science and related subjects in electron physics

Peter W. Hawkes (Edited by), Martin Hÿtch (Edited by)

9780443193200

Hardback, published 6 June 2023

374 pages
22.9 x 15.2 x 2.1 cm, 0.73 kg

Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

1. The electron optical imaging system and its aberrations

Jiye Ximen

2. The electromagnetic deflection system and its aberrations

Jiye Ximen

3. The electromagnetic multipole system and its aberrations

Jiye Ximen

4. The ion optical system and its aberrations

Jiye Ximen

5. Computer aided design of electron and ion optical systems

Subject Areas: Signal processing [UYS], Electronic devices & materials [TJFD], Mechanical engineering [TGB]