{"product_id":"x-ray-diffraction-procedures-for-polycrystalline-and-amorphous-materials-hardback-9780471493693","title":"X-Ray Diffraction Procedures; For Polycrystalline and Amorphous Materials (Hardback) 9780471493693","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eX-Ray Diffraction Procedures\u003c\/font\u003e\u003cbr\u003e\r\n\u003cfont size=\"5\"\u003eFor Polycrystalline and Amorphous Materials\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eHarold P. Klug (Author), Leroy E. Alexander (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780471493693, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 1 January 1974\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e992 pages\u003cbr\u003e23 x 15.8 x 5.2 cm, 1.27 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003e\u003cp\u003e\u003cb\u003eA complete view of x-ray diffraction procedures\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eFor those working in the field who wish to go beyond push-button applications, \u003ci\u003eX-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials\u003c\/i\u003e provides a strong guide to the science and practical techniques of geometrical crystallography and x-ray diffraction of crystals. The book then moves on to provide more complete coverage of space lattices, point groups and space groups, the production of x-rays, measurement of x-rays, photographic powder techniques, and a host of other related topics. The book is then rounded out with a number of appendices for further reference.\u003c\/p\u003e\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e1. Elementary Crystallography. \u003cp\u003e1-1 The Crystalline State.\u003c\/p\u003e \u003cp\u003e1-1.1 Crystalline and Amorphous Solids.\u003c\/p\u003e \u003cp\u003e1-1.2 Definition of a Crystal.\u003c\/p\u003e \u003cp\u003e1-1.3 Characteristics of the Crystalline and Vitreous States.\u003c\/p\u003e \u003cp\u003e1-2 Crystal Geometry.\u003c\/p\u003e \u003cp\u003e1-2.1 External Form and Habit of Crystals.\u003c\/p\u003e \u003cp\u003e1-2.2 Constancy of Interfacial Angles.\u003c\/p\u003e \u003cp\u003e1-2.3 Symmetry Elements of Crystals.\u003c\/p\u003e \u003cp\u003e1-2.4 Pseudosymmetry, 13.\u003c\/p\u003e \u003cp\u003e1-2.5 Crystallographic Axes.\u003c\/p\u003e \u003cp\u003e1-2.6 Axial Ratios.\u003c\/p\u003e \u003cp\u003e1-2.7 The Six Crystal Symmetry Systems.\u003c\/p\u003e \u003cp\u003e1-2.8 Miller Indices.\u003c\/p\u003e \u003cp\u003e1-2.9 The Law of Rational Indices.\u003c\/p\u003e \u003cp\u003e1-2.10 Crystal Forms.\u003c\/p\u003e \u003cp\u003e1-2.11 Composite Crystals and Twinning.\u003c\/p\u003e \u003cp\u003e1-2.12 Equation for the Plane (hkl).\u003c\/p\u003e \u003cp\u003e1-2.13 Zones and Zone Relationships.\u003c\/p\u003e \u003cp\u003e1-3 Space Lattices.\u003c\/p\u003e \u003cp\u003e1-3.1 Historical Introduction.\u003c\/p\u003e \u003cp\u003e1-3.2 Definition.\u003c\/p\u003e \u003cp\u003e1-3.3 The Unit Ceil.\u003c\/p\u003e \u003cp\u003e1-3.4 The 14 Bravais Lattices.\u003c\/p\u003e \u003cp\u003e1-3.5 Some Crystallographic Implications of Space Lattices.\u003c\/p\u003e \u003cp\u003e1-3.6 Distance between Neighboring Lattice Planes in the Series (hkl).\u003c\/p\u003e \u003cp\u003e1-3.7 The Reciprocal Lattice.\u003c\/p\u003e \u003cp\u003e1-4 Point Groups and Space Groups.\u003c\/p\u003e \u003cp\u003e1-4.1 The Point Group or Crystal Symmetry Class.\u003c\/p\u003e \u003cp\u003e1-4.2 The Space Group.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e2. The Production and Properties of X-rays.\u003c\/p\u003e \u003cp\u003e2-1 X-Ray Safety and Protection.\u003c\/p\u003e \u003cp\u003e2-2 The Production of X-Rays.\u003c\/p\u003e \u003cp\u003e2-2.1 The Origin of X-Rays.\u003c\/p\u003e \u003cp\u003e2-2.2 X-Ray Tubes.\u003c\/p\u003e \u003cp\u003eA. Gas tubes.\u003c\/p\u003e \u003cp\u003eB. Hot-cathode tubes.\u003c\/p\u003e \u003cp\u003eC. Modern diffraction tube design.\u003c\/p\u003e \u003cp\u003eD. Cold-cathode diffraction tubes.\u003c\/p\u003e \u003cp\u003eE. High-intensity diffraction tubes.\u003c\/p\u003e \u003cp\u003eF. Microfocus diffraction tubes.\u003c\/p\u003e \u003cp\u003e2-2.3 Power Equipment for the Production of X-rays.\u003c\/p\u003e \u003cp\u003e2-2.4 Commercial X-ray Generators for Diffraction.\u003c\/p\u003e \u003cp\u003e2-2.5 Isotopic X-ray Sources.\u003c\/p\u003e \u003cp\u003e2-3 Properties of X-Rays and their Measurement.\u003c\/p\u003e \u003cp\u003e2-3.1 The X-ray Spectrum of an Element.\u003c\/p\u003e \u003cp\u003eA. The continuous x-ray spectrum.\u003c\/p\u003e \u003cp\u003eB. The characteristic x-ray spectrum.\u003c\/p\u003e \u003cp\u003e2-3.2 The Precise Determination of X-ray Wavelengths.\u003c\/p\u003e \u003cp\u003e2-3.3 Absorption of X-rays.\u003c\/p\u003e \u003cp\u003e2-3.4 Secondary Fluorescent and Scattered X-rays.\u003c\/p\u003e \u003cp\u003e2-3.5 Refraction of X-rays.\u003c\/p\u003e \u003cp\u003e2-3.6 Monochromatization of X-radiation.\u003c\/p\u003e \u003cp\u003eA. Single filter technique.\u003c\/p\u003e \u003cp\u003eB. Balanced-filter technique.\u003c\/p\u003e \u003cp\u003eC. Crystal monochromator techniques.\u003c\/p\u003e \u003cp\u003eD. Graphite monochromators.\u003c\/p\u003e \u003cp\u003e2-3.7 The Photographic Effects of X-rays.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e3. Fundamental Principles of X-ray Diffraction.\u003c\/p\u003e \u003cp\u003e3-1 Kinematical and Dynamical Diffraction Theory.\u003c\/p\u003e \u003cp\u003e3-2 The Geometry of Diffraction.\u003c\/p\u003e \u003cp\u003e3-2.1 Scattering of X-rays by Electrons and Atoms.\u003c\/p\u003e \u003cp\u003e3-2.2 Scattering by a Regularly Spaced Row of Atoms.\u003c\/p\u003e \u003cp\u003e3-2.3 Conditions for Diffraction by a Linear Lattice of Atoms.\u003c\/p\u003e \u003cp\u003e3-2.4 Diffraction by a Simple Cubic Lattice.\u003c\/p\u003e \u003cp\u003e3-2.5 Proof that the \"Diffracting Plane\" is a Lattice Plane.\u003c\/p\u003e \u003cp\u003e3-2.6 The Bragg Equation.\u003c\/p\u003e \u003cp\u003e3-2.7 Derivation of the Bragg Equation from the \"Reflection\" Analogy.\u003c\/p\u003e \u003cp\u003e3-2.8 The Geometrical Picture of Diffraction in Reciprocal Space.\u003c\/p\u003e \u003cp\u003e3-3 The Intensity of Diffraction.\u003c\/p\u003e \u003cp\u003e3-3.1 Perfect and Imperfect Crystals.\u003c\/p\u003e \u003cp\u003e3-3.2 Primary and Secondary Extinction.\u003c\/p\u003e \u003cp\u003e3-3.3 Relative and Absolute Intensities.\u003c\/p\u003e \u003cp\u003e3-3.4 Factors Affecting the Diffraction Intensities.\u003c\/p\u003e \u003cp\u003eA. The polarization factor.\u003c\/p\u003e \u003cp\u003eB. The Lorentz and \"velocity\" factors.\u003c\/p\u003e \u003cp\u003eC. The temperature factor.\u003c\/p\u003e \u003cp\u003eD. The atomic scattering factor.\u003c\/p\u003e \u003cp\u003eE. The structure factor.\u003c\/p\u003e \u003cp\u003eF. The multiplicity factor.\u003c\/p\u003e \u003cp\u003eG. The absorption factor.\u003c\/p\u003e \u003cp\u003e3-3.5 Expressions for the Relative Intensity of Diffraction by the Various Techniques.\u003c\/p\u003e \u003cp\u003e3-3.6 Lattice-Centering and Space-Group Extinctions.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e4. Photographic Powder Techniques.\u003c\/p\u003e \u003cp\u003e4-1 The Debye-Scherrer Method.\u003c\/p\u003e \u003cp\u003e4-1.1 Introduction.\u003c\/p\u003e \u003cp\u003e4-1.2 Camera Design.\u003c\/p\u003e \u003cp\u003eA. General geometry.\u003c\/p\u003e \u003cp\u003eB. Details of camera construction.\u003c\/p\u003e \u003cp\u003eC. Camera support and alignment.\u003c\/p\u003e \u003cp\u003e4-1.3 Preparation of the Powder.\u003c\/p\u003e \u003cp\u003e4-1.4 Mounting the Powder.\u003c\/p\u003e \u003cp\u003e4-1.5 Making the Exposure.\u003c\/p\u003e \u003cp\u003e4-1.6 Processing the Film.\u003c\/p\u003e \u003cp\u003e4-2 Parafocusing Methods.\u003c\/p\u003e \u003cp\u003e4-3 Monochromatic-Pinhole Techniques.\u003c\/p\u003e \u003cp\u003e4-3.1 Forward-Reflection Method.\u003c\/p\u003e \u003cp\u003e4-3.2 Back-Reflection Method.\u003c\/p\u003e \u003cp\u003e4-4 Microcameras and Microbeam Techniques.\u003c\/p\u003e \u003cp\u003e4-5 High-Temperature Techniques.\u003c\/p\u003e \u003cp\u003e4-6 Low-Temperature Techniques.\u003c\/p\u003e \u003cp\u003e4-7 High-Pressure Techniques.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003eDiffractometric Powder Technique.\u003c\/p\u003e \u003cp\u003e5-1 Geometry of the Powder Diffractometer.\u003c\/p\u003e \u003cp\u003e5-1.1 General Features.\u003c\/p\u003e \u003cp\u003e5-1.2 Details of the Optical Arrangement.\u003c\/p\u003e \u003cp\u003e5-1.3 The Seemann-Bohlin Diffractometer.\u003c\/p\u003e \u003cp\u003e5-1.4 Alignment and Angular Calibration of the Diffractometer.\u003c\/p\u003e \u003cp\u003eA. Operations appropriately performed in advance by the manufacturer.\u003c\/p\u003e \u003cp\u003eB. Further internal alignment of the goniometer.\u003c\/p\u003e \u003cp\u003eC. Alignment of the goniometer with respect to the x-ray tube.\u003c\/p\u003e \u003cp\u003eD. Calibration of the O° 2Θ position.\u003c\/p\u003e \u003cp\u003eE. Calibration of angular registration between 0 and 180° 2Θ.\u003c\/p\u003e \u003cp\u003e5-2 Profiles and positions of diffraction maxima.\u003c\/p\u003e \u003cp\u003e5-2.1 Convolution Synthesis of Line Profiles.\u003c\/p\u003e \u003cp\u003eA. X-ray source, g\u003csub\u003eI\u003c\/sub\u003e.\u003c\/p\u003e \u003cp\u003eB. Flat specimen surface, g\u003csub\u003eII\u003c\/sub\u003e.\u003c\/p\u003e \u003cp\u003eC. Axial divergence, g\u003csub\u003eIII\u003c\/sub\u003e.\u003c\/p\u003e \u003cp\u003eD. Specimen transparency, g\u003csub\u003eIV\u003c\/sub\u003e.\u003c\/p\u003e \u003cp\u003eE. Receiving slit, g\u003csub\u003ev\u003c\/sub\u003e.\u003c\/p\u003e \u003cp\u003eF. Comparison of calculated and experimental line profiles.\u003c\/p\u003e \u003cp\u003e5-2.2 Displacement and Breadth of Diffraction Maxima.\u003c\/p\u003e \u003cp\u003eA. Line position.\u003c\/p\u003e \u003cp\u003eB. Line breadth.\u003c\/p\u003e \u003cp\u003eC. The practical determination of the centroid and variance.\u003c\/p\u003e \u003cp\u003e5-2.3 Accurate Determination of Interplanar (d) Spacings.\u003c\/p\u003e \u003cp\u003e5-2.4 \"Routine\" Determination of Interplanar (d) Spacings.\u003c\/p\u003e \u003cp\u003e5-3 Electrical Characteristics of the Diffractometer.\u003c\/p\u003e \u003cp\u003e5-3.1 General Arrangement of Components.\u003c\/p\u003e \u003cp\u003e5-3.2 Radiation Detectors (Quantum Counters).\u003c\/p\u003e \u003cp\u003eA. Gas-ionization counters.\u003c\/p\u003e \u003cp\u003eB. Geiger-Müller counters.\u003c\/p\u003e \u003cp\u003eC. Proportional counters.\u003c\/p\u003e \u003cp\u003eD. Scintillation counters.\u003c\/p\u003e \u003cp\u003eE. Solid-state (energy-dispersive) detectors.\u003c\/p\u003e \u003cp\u003e5-3.3 Nonlinearity of Detector Response.\u003c\/p\u003e \u003cp\u003e5-3.4 Monochromatizing Techniques.\u003c\/p\u003e \u003cp\u003eA. Pulse-height discrimination and analysis.\u003c\/p\u003e \u003cp\u003eB. Ross balanced filters.\u003c\/p\u003e \u003cp\u003eC. Crystal monochromators.\u003c\/p\u003e \u003cp\u003e5-4 Choice of Experimental Conditions and Procedures.\u003c\/p\u003e \u003cp\u003e5-4.1 Statistical Accuracy of Counter Measurements.\u003c\/p\u003e \u003cp\u003e5-4.2 The Specimen.\u003c\/p\u003e \u003cp\u003eA. Preparation of powders.\u003c\/p\u003e \u003cp\u003eB. Rotation of the specimen.\u003c\/p\u003e \u003cp\u003eC. Preferred orientation and the specimen mount.\u003c\/p\u003e \u003cp\u003eD. High-temperature techniques.\u003c\/p\u003e \u003cp\u003eE. Low-temperature techniques.\u003c\/p\u003e \u003cp\u003eF. Other special specimen techniques.\u003c\/p\u003e \u003cp\u003e5-4.3 Transmission Techniques.\u003c\/p\u003e \u003cp\u003e5-4.4 Continuous-Scan Techniques.\u003c\/p\u003e \u003cp\u003e5-4.5 Step-Scan Techniques and Automation.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e6. The Interpretation of Powder Diffraction Data.\u003c\/p\u003e \u003cp\u003e6-1 The Viewing and Precision Measurement of Powder Photographs.\u003c\/p\u003e \u003cp\u003e6-2 Determination of Interplanar (d) Spacings.\u003c\/p\u003e \u003cp\u003e6-2.1 Debye-Scherrer Patterns, 424.\u003c\/p\u003e \u003cp\u003e6-2.2 Monochromatic-Pinhole (Flat-Film) Patterns, 435.\u003c\/p\u003e \u003cp\u003e6-3 Indexing Cubic Powder Patterns.\u003c\/p\u003e \u003cp\u003e6-3.1 Reciprocal-Lattice Picture of Diffraction by a Cubic Powder.\u003c\/p\u003e \u003cp\u003e6-3.2 Indexing a Cubic Pattern by sin\u003csup\u003e2\u003c\/sup\u003e Θ Ratios.\u003c\/p\u003e \u003cp\u003e6-3.3 Determination of the Unit-Cell Dimension a.\u003c\/p\u003e \u003cp\u003e6-3.4 Indexing a Cubic Pattern When a Is Known.\u003c\/p\u003e \u003cp\u003e6-4 Determination of Lattice Type.\u003c\/p\u003e \u003cp\u003e6-5 Indexing Noncubic Powder Patterns.\u003c\/p\u003e \u003cp\u003e6-5.1 Indexing Noncubic Patterns When the Unit-Cell Dimensions are Known.\u003c\/p\u003e \u003cp\u003e6-5.2 Graphical Methods of Indexing.\u003c\/p\u003e \u003cp\u003e6-5.3 Analytical Methods of Indexing: Tetragonal, Hexagonal, and Orthorhombic Patterns.\u003c\/p\u003e \u003cp\u003e6-5.4 Analytical Methods of Indexing: Monoclinic and Triclinic Patterns.\u003c\/p\u003e \u003cp\u003e6-6 Automated Computing Procedures for Indexing Powder Patterns.\u003c\/p\u003e \u003cp\u003e6-6.1 Programs for Patterns of Orthorhombic and Higher Symmetry.\u003c\/p\u003e \u003cp\u003e6-6.2 Programs for Patterns of Low Symmetry.\u003c\/p\u003e \u003cp\u003e6-7 The Measurement of Intensities from Photographic Blackening.\u003c\/p\u003e \u003cp\u003e6-7.1 Introduction.\u003c\/p\u003e \u003cp\u003e6-7.2 Preparation of a Graded Intensity Scale.\u003c\/p\u003e \u003cp\u003e6-7.3 Visual Estimation of Intensities.\u003c\/p\u003e \u003cp\u003e6-7.4 Photometer Techniques.\u003c\/p\u003e \u003cp\u003e6-8 The Measurement of Intensities with the X-Ray Diffractometer.\u003c\/p\u003e \u003cp\u003e6-9 Putting Intensities on an Absolute Scale.\u003c\/p\u003e \u003cp\u003e6-10 Special Scattering and Diffraction Effects.\u003c\/p\u003e \u003cp\u003e6-10.1 Background Effects.\u003c\/p\u003e \u003cp\u003eA. Background due to lattice imperfections.\u003c\/p\u003e \u003cp\u003eB. Background due to general radiation.\u003c\/p\u003e \u003cp\u003eC. Absorption discontinuities.\u003c\/p\u003e \u003cp\u003eD. Air scatter.\u003c\/p\u003e \u003cp\u003eE. Secondary fluorescence radiation.\u003c\/p\u003e \u003cp\u003e6-10.2 Reflections of Unusual Character.\u003c\/p\u003e \u003cp\u003eA. Spotty lines.\u003c\/p\u003e \u003cp\u003eB. Arclike lines.\u003c\/p\u003e \u003cp\u003eC. Broadened lines.\u003c\/p\u003e \u003cp\u003eD. Two-dimensional lattice lines.\u003c\/p\u003e \u003cp\u003eE. Splitting of lines.\u003c\/p\u003e \u003cp\u003e6-10.3 Spurions lines.\u003c\/p\u003e \u003cp\u003eA. Lines due to misalignment of camera elements.\u003c\/p\u003e \u003cp\u003eB. Diffraction effects from the sample mount.\u003c\/p\u003e \u003cp\u003eC. Diffraction from radiation contaminants.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e7. Qualitative and Quantitative Analysis of Crystalline Powders.\u003c\/p\u003e \u003cp\u003e7-1 Routine Qualitative Identification of Crystalline Powders.\u003c\/p\u003e \u003cp\u003e7-1.1 The JCPDS Powder Diffraction File (PDF).\u003c\/p\u003e \u003cp\u003e7-1.2 Experimental Technique of the PDF Method.\u003c\/p\u003e \u003cp\u003eA. Preparation of the diffraction pattern.\u003c\/p\u003e \u003cp\u003eB. Measurement of lines on films and diffractometer charts.\u003c\/p\u003e \u003cp\u003eC. Identification interpretation of the data.\u003c\/p\u003e \u003cp\u003e7-1.3 Computer Applications in the PDF Method.\u003c\/p\u003e \u003cp\u003e7-1.4 Complications and Limitations of the PDF Method.\u003c\/p\u003e \u003cp\u003e7-1.5 Special Identification Techniques.\u003c\/p\u003e \u003cp\u003eA. Compound identification by isomorphism.\u003c\/p\u003e \u003cp\u003eB. Procedures for or ganic compounds.\u003c\/p\u003e \u003cp\u003eC. Identification of clay minerals.\u003c\/p\u003e \u003cp\u003e7-2 Quantitative Analysis of Powder Mixtures.\u003c\/p\u003e \u003cp\u003e7-2.1 Basic Aspects of Absorption in Quantitative Analysis.\u003c\/p\u003e \u003cp\u003eA. Mixtures of N components: µ\u003csup\u003e*\u003c\/sup\u003e\u003csub\u003eJ\u003c\/sub\u003e = ???\u003csup\u003e*\u003c\/sup\u003e.\u003c\/p\u003e \u003cp\u003eB. Mixtures of two components: µ\u003csup\u003e*\u003c\/sup\u003e\u003csub\u003e1\u003c\/sub\u003e ??? µ\u003csup\u003e*\u003c\/sup\u003e\u003csub\u003eM\u003c\/sub\u003e.\u003c\/p\u003e \u003cp\u003eC. Mixtures of N components: (N \u0026gt; 2); µ\u003csup\u003e*\u003c\/sup\u003e\u003csub\u003e1\u003c\/sub\u003e ??? µ\u003csup\u003e*\u003c\/sup\u003e\u003csub\u003eM\u003c\/sub\u003e.\u003c\/p\u003e \u003cp\u003e7-2.2 Photographic-Microphotometric Technique.\u003c\/p\u003e \u003cp\u003e7-2.3 Counter Diffractometric Technique.\u003c\/p\u003e \u003cp\u003eA. Instrumental requirements.\u003c\/p\u003e \u003cp\u003eB. General recommendations on procedure.\u003c\/p\u003e \u003cp\u003e7-2.4 Outline of Important Analytical Procedures.\u003c\/p\u003e \u003cp\u003eA. Direct analysis when µ\u003csup\u003e*\u003c\/sup\u003e\u003csub\u003eJ\u003c\/sub\u003e = ???\u003csup\u003e*\u003c\/sup\u003e.\u003c\/p\u003e \u003cp\u003eB. Direct analysis of two-component syatems, µ\u003csup\u003e*\u003c\/sup\u003e\u003csub\u003e1\u003c\/sub\u003e ??? µ\u003csup\u003e*\u003c\/sup\u003e\u003csub\u003e2\u003c\/sub\u003e.\u003c\/p\u003e \u003cp\u003eC. Direct analysis by absorption-diffraction, multicomponent systems.\u003c\/p\u003e \u003cp\u003eD. Internal-standard analysis for one component of a multicomponent system, no interfering lines.\u003c\/p\u003e \u003cp\u003eE. Internal-standard analysis for one component, interfering lines of unknown and standard.\u003c\/p\u003e \u003cp\u003eF. Simultaneous analysis for several components with allowance for line superpositions.\u003c\/p\u003e \u003cp\u003eG. Analysis by dilution of sample with y\u003csub\u003eJ\u003c\/sub\u003e grams of unknown per gram of sample.\u003c\/p\u003e \u003cp\u003e7-2.5 Selected Examples and Applications.\u003c\/p\u003e \u003cp\u003eA. Dust analysis.\u003c\/p\u003e \u003cp\u003eB. Retained austenite in steel.\u003c\/p\u003e \u003cp\u003eC. Organic mixtures.\u003c\/p\u003e \u003cp\u003eD. Miscellaneous inorganic analyses.\u003c\/p\u003e \u003cp\u003eE. Analysis of solid-solution phases.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e8. The Precision Determination of Lattice Constants.\u003c\/p\u003e \u003cp\u003e8-l General Considerations.\u003c\/p\u003e \u003cp\u003e8-2 Sources of Systematic Errors in the Debye-Scherrer Method.\u003c\/p\u003e \u003cp\u003e8-2.1 Radius Errors and Film Shrinkage.\u003c\/p\u003e \u003cp\u003e8-2.2 Specimen Eccentricity.\u003c\/p\u003e \u003cp\u003e8-2.3 Sample Absorption and Radial Divergence of the Beam.\u003c\/p\u003e \u003cp\u003eA. Bradley and Jay's approximate treatment.\u003c\/p\u003e \u003cp\u003eB. More rigorous investigations of the absorption error.\u003c\/p\u003e \u003cp\u003e8-2.4 Axial Divergence of the Beam.\u003c\/p\u003e \u003cp\u003e8-3 Methods of Correcting for Errors in the Debye-Scherrer Method.\u003c\/p\u003e \u003cp\u003e8-3.1 Use of Calibrating Substances.\u003c\/p\u003e \u003cp\u003e8-3.2 The Straumanis Method of Refined Experimental Technique.\u003c\/p\u003e \u003cp\u003eA. Essential features of the Straumanis method.\u003c\/p\u003e \u003cp\u003eB. Illustrative film measurements and calculations.\u003c\/p\u003e \u003cp\u003e8-3.3 The Convolution-Film Method with the Likelihood Ratio Method.\u003c\/p\u003e \u003cp\u003eA. The Convolution-Film Method (CFM).\u003c\/p\u003e \u003cp\u003eB. The Likelihood Ratio Method (LRM).\u003c\/p\u003e \u003cp\u003eC. Application of the Convolution-Film Method to IUCr Silicon.\u003c\/p\u003e \u003cp\u003e8-3.4 Use of Extrapolation Methods.\u003c\/p\u003e \u003cp\u003eA. Bradley and Jay's extrapolation against cos\u003csup\u003e2\u003c\/sup\u003e Θ.\u003c\/p\u003e \u003cp\u003eB. Extrapolation against (cos\u003csup\u003e2\u003c\/sup\u003e Θ)\/sin Θ + (cos\u003csup\u003e2\u003c\/sup\u003e Θ)\/Θ.\u003c\/p\u003e \u003cp\u003eC. Cohen's Least-Squares Extrapolation.\u003c\/p\u003e \u003cp\u003e8-4 Precise Lattice Constants by other Film Techniques.\u003c\/p\u003e \u003cp\u003e8-5 Precise Lattice Constants from Diffractometric Measurements.\u003c\/p\u003e \u003cp\u003e8-6 The Precision Determination of Lattice Constants of Noncubic Materials.\u003c\/p\u003e \u003cp\u003e8-7 Summary.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e9. Crystallite Size and Lattice Strains From Line Broadening.\u003c\/p\u003e \u003cp\u003e9-1 Determination of the Pure Line Profile.\u003c\/p\u003e \u003cp\u003e9-1.1 The Fourier-Transform Method.\u003c\/p\u003e \u003cp\u003eThe Rachinger Correction.\u003c\/p\u003e \u003cp\u003e9-1.2 The Method of Iterative Folding.\u003c\/p\u003e \u003cp\u003e9-1.3 Simplified Methods.\u003c\/p\u003e \u003cp\u003eGaussian or Cauchy Profiles.\u003c\/p\u003e \u003cp\u003eB. Jones' Correction Curves for Debye-Scherrer Lines.\u003c\/p\u003e \u003cp\u003eC. The Kα\u003csub\u003e1\u003c\/sub\u003eα\u003csub\u003e2\u003c\/sub\u003e Doublet Correction for the Debye-Scherrer Technique.\u003c\/p\u003e \u003cp\u003eD. Correction Curves for Diffractometer Line Profiles.\u003c\/p\u003e \u003cp\u003e9-2 Determination of Crystallite Size and Lattice Imperfections Simultaneously.\u003c\/p\u003e \u003cp\u003e9-2.1 Introduction.\u003c\/p\u003e \u003cp\u003e9-2.2 The Fourier Method of Warren and Averbach.\u003c\/p\u003e \u003cp\u003eA. Derivation of the Fourier series expression.\u003c\/p\u003e \u003cp\u003eB. Separation of size and distortion components.\u003c\/p\u003e \u003cp\u003eC. Generalization of the Warren-Averbach theory.\u003c\/p\u003e \u003cp\u003e9-2.3 Use of Variance of the Line Profile.\u003c\/p\u003e \u003cp\u003eA. Contribution of crystallite size to the variance.\u003c\/p\u003e \u003cp\u003eB. Contribution of lattice distortions to the variance.\u003c\/p\u003e \u003cp\u003e9-2.4 Method of Integral Breadths.\u003c\/p\u003e \u003cp\u003e9-2.5 Determination of Faulting in Layered Structures.\u003c\/p\u003e \u003cp\u003eA. Deformation and twin faulting.\u003c\/p\u003e \u003cp\u003eB. Random-layer (turbostratic) structures.\u003c\/p\u003e \u003cp\u003e9-2.6 Very Defective Lattices.\u003c\/p\u003e \u003cp\u003e9-2.7 Illustrative Analyses.\u003c\/p\u003e \u003cp\u003eA. Cold-worked copper-silicon single crystal, Fourier method.\u003c\/p\u003e \u003cp\u003eDeformed thoriated tungsten, variance method.\u003c\/p\u003e \u003cp\u003eC. Deformed cubic metals, Fourier and integral-breadth methods, compound fault probability evaluated.\u003c\/p\u003e \u003cp\u003eD. Comparison of size and strain values derived by four methods.\u003c\/p\u003e \u003cp\u003eE. Additional literature.\u003c\/p\u003e \u003cp\u003e9-3 Determination of Crystallite Size-No Lattice Imperfections.\u003c\/p\u003e \u003cp\u003e9-3.1 The Scherrer Equation.\u003c\/p\u003e \u003cp\u003eCrystallites of markedly anisotropic shapes.\u003c\/p\u003e \u003cp\u003e9-3.2 The Variance Method.\u003c\/p\u003e \u003cp\u003e9-3.3 Size Distributions.\u003c\/p\u003e \u003cp\u003e9-3.4 Some Practical Considerations.\u003c\/p\u003e \u003cp\u003e9-3.5 Illustrative Analyses.\u003c\/p\u003e \u003cp\u003eA. Crystallite shape-Magnesium Oxide (MgO) powder.\u003c\/p\u003e \u003cp\u003eB. MgO from decomposition of MgCO\u003csub\u003e3\u003c\/sub\u003e at 600°C.\u003c\/p\u003e \u003cp\u003eC. MgO from decomposition of MgCO\u003csub\u003e3\u003c\/sub\u003e at 900°C.\u003c\/p\u003e \u003cp\u003eD. Micronized quartzite powder, fraction \u0026lt; 5µ.\u003c\/p\u003e \u003cp\u003eE. L\u003csub\u003ec\u003c\/sub\u003e dimension of a carbon black.\u003c\/p\u003e \u003cp\u003eF. L\u003csub\u003ea\u003c\/sub\u003e dimension of a carbon black.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e10. Investigation of Preferred Orientation and Texture.\u003c\/p\u003e \u003cp\u003e10-1 Orientation and Texture in Materials.\u003c\/p\u003e \u003cp\u003e10-2 Geometry of Fiber Patterns.\u003c\/p\u003e \u003cp\u003e10-2.1 Ideal Fiber Patterns.\u003c\/p\u003e \u003cp\u003e10-2.2 Bragg Geometry of Fiber Patterns.\u003c\/p\u003e \u003cp\u003e10-2.3 Real Fiber Patterns.\u003c\/p\u003e \u003cp\u003e10-3 Preparation of Fiber Patterns.\u003c\/p\u003e \u003cp\u003e10-4 Analysis of Simple Fiber Patterns.\u003c\/p\u003e \u003cp\u003e10-5 Representation of Preferred Orientation.\u003c\/p\u003e \u003cp\u003e10-5.1 Pole Figtires.\u003c\/p\u003e \u003cp\u003e10-5.2 The Stereographic Projection.\u003c\/p\u003e \u003cp\u003e10-5.3 Inverse Pole Figures.\u003c\/p\u003e \u003cp\u003e10-6 Preparation of Pole Figures.\u003c\/p\u003e \u003cp\u003e10-6.1 Photographic Methods.\u003c\/p\u003e \u003cp\u003e10-6.2 Diffractometric Techniques.\u003c\/p\u003e \u003cp\u003eA. Introduction.\u003c\/p\u003e \u003cp\u003eB. Transmission technique; sheet specimen.\u003c\/p\u003e \u003cp\u003eC. Reflection technique; sheet specimen.\u003c\/p\u003e \u003cp\u003eD. Special instrumentation.\u003c\/p\u003e \u003cp\u003eE. The specimen and its alignment.\u003c\/p\u003e \u003cp\u003e10-7 Miscellaneous.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003e11. Stress Measurement in Metals.\u003c\/p\u003e \u003cp\u003e11-1 Advantages and Disadvantages of Diffraction Methods.\u003c\/p\u003e \u003cp\u003e11-2 Elastic Stress-Strain Relationships.\u003c\/p\u003e \u003cp\u003e11-3 Sum of the Principal Stresses in a Surface.\u003c\/p\u003e \u003cp\u003e11-4 Component of Stress in any Desired Direction in a Surface.\u003c\/p\u003e \u003cp\u003e11-4.1 Photographic Techniques.\u003c\/p\u003e \u003cp\u003eA. Double-Exposure Technique (DET).\u003c\/p\u003e \u003cp\u003eB. Single-Exposure Technique (SET).\u003c\/p\u003e \u003cp\u003eC. General Considerations.\u003c\/p\u003e \u003cp\u003e11-4.2 Diffractometric Techniques.\u003c\/p\u003e \u003cp\u003e11-4.3 Selected Investigations.\u003c\/p\u003e \u003cp\u003eA. Hardened Steel: Comparison of X-Ray and Mechanical Stress Measurements.\u003c\/p\u003e \u003cp\u003eB. Aluminum Alloy 2024 and Ingot Iron: Determination of Elastic constants.\u003c\/p\u003e \u003cp\u003eC. High-strength aluminum alloys: residual stress measurements.\u003c\/p\u003e \u003cp\u003eD. Measurement of a triaxial residual stress.\u003c\/p\u003e \u003cp\u003eE. Other experimental work and information.\u003c\/p\u003e \u003cp\u003e11-5 Problems Raised by Plastic Deformation.\u003c\/p\u003e \u003cp\u003eGeneral Reverences.\u003c\/p\u003e \u003cp\u003eSvecific References.\u003c\/p\u003e \u003cp\u003e12. Radial-Distribution Studies of Noncrystalline Materials.\u003c\/p\u003e \u003cp\u003e12-1 Theory.\u003c\/p\u003e \u003cp\u003e12-2 Experimental Requirements.\u003c\/p\u003e \u003cp\u003e12-3 Correction and Scaling of Experimental Intensities to Absolute (Electron) Units.\u003c\/p\u003e \u003cp\u003e12-3.1 Correction for Air Scatter.\u003c\/p\u003e \u003cp\u003e12-3.2 Correction for Absorption by the Sample.\u003c\/p\u003e \u003cp\u003e12-3.3 Correction for Polarization.\u003c\/p\u003e \u003cp\u003e12-3.4 Correction for Incoherent Scattering.\u003c\/p\u003e \u003cp\u003e12-4 Unified Determination of µT, i(S), and Scaling Factor K.\u003c\/p\u003e \u003cp\u003e12-5 Representative Experimental Procedure.\u003c\/p\u003e \u003cp\u003e12-6 Sources of Error.\u003c\/p\u003e \u003cp\u003e12-6.1 Choice of Increment ΔS in the Computation of ΣSi(S) sin rS ΔS.\u003c\/p\u003e \u003cp\u003e12-6.2 Scaling of the Experimental Intensity Curve; Absorption orrections.\u003c\/p\u003e \u003cp\u003e12-6.3 Discrete Errors in Si(S); Termination-of-Series Errors.\u003c\/p\u003e \u003cp\u003e12-7 Specific Procedures for Minimizing Errors.\u003c\/p\u003e \u003cp\u003e12-7.1 Application of a Damping Factor.\u003c\/p\u003e \u003cp\u003e12-7.2 Use of an Electronic Distribution Function.\u003c\/p\u003e \u003cp\u003e12-7.3 General Procedure for Removing Spurious Features from the RDF.\u003c\/p\u003e \u003cp\u003e12-7.4 Method for Correcting the RDF for Termination-of-Series Errors Only.\u003c\/p\u003e \u003cp\u003e12-8 Practical Examples.\u003c\/p\u003e \u003cp\u003e12-8.1 Carbon Black.\u003c\/p\u003e \u003cp\u003e12-8.2 Carbon Black: Unified Determination of µT, i(S), and Scaling Factor K.\u003c\/p\u003e \u003cp\u003e12-8.3 Silica Glass.\u003c\/p\u003e \u003cp\u003e12-8.4 Liquid Argon.\u003c\/p\u003e \u003cp\u003e12-8.5 Vitreous Selenium.\u003c\/p\u003e \u003cp\u003e12-8.6 Identification of Noncrystalline Patterns.\u003c\/p\u003e \u003cp\u003e12-8.7 Other Representative Studies.\u003c\/p\u003e \u003cp\u003eA. Liquid hydrocarbons.\u003c\/p\u003e \u003cp\u003eB. Binary alloys.\u003c\/p\u003e \u003cp\u003eC. Aggregates of oriented linear and planar molecules.\u003c\/p\u003e \u003cp\u003eD. Helical molecules in solution.\u003c\/p\u003e \u003cp\u003eE. Biological systems.\u003c\/p\u003e \u003cp\u003eF. Oriented systems.\u003c\/p\u003e \u003cp\u003e12-9 Further Remarks on Experimental Techniques.\u003c\/p\u003e \u003cp\u003e12-10 Characterization of Ordering in Polymers.\u003c\/p\u003e \u003cp\u003eGeneral References.\u003c\/p\u003e \u003cp\u003eSpecific References.\u003c\/p\u003e \u003cp\u003eAppendix I Layout for a Diffraction Laboratory.\u003c\/p\u003e \u003cp\u003eAppendix II The Handling and Processing of X-ray Film.\u003c\/p\u003e \u003cp\u003eAppendix III Miscellaneous Constants and Numerical Data.\u003c\/p\u003e \u003cp\u003eAppendix IV International Atomic Weights.\u003c\/p\u003e \u003cp\u003eAppendix V Mass Absorption Coefficients µ\/??? of the Elements (Z = 1 to 83) for a Selection of Wavelengths.\u003c\/p\u003e \u003cp\u003eAppendix VI Quadratic Forms for the Cubic System.\u003c\/p\u003e \u003cp\u003eAppendix VII Atomic and Ionic Scattering Factors.\u003c\/p\u003e \u003cp\u003eAppendix VIII Lorentz and Polarization Factors.\u003c\/p\u003e \u003cp\u003eAppendix IX Temperature Factor Table.\u003c\/p\u003e \u003cp\u003eAppendix X Warren's Powder Pattern Power Theorem.\u003c\/p\u003e \u003cp\u003eAuthor Index.\u003c\/p\u003e \u003cp\u003eSubject Index.\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Mechanical engineering \u0026amp; materials [\u003ca title=\"See our other books on Mechanical engineering \u0026amp; materials\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Mechanical%20engineering%20\u0026amp;%20materials%20%5BTG%5D%22\"\u003eTG\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-Interscience","offers":[{"title":"Brand New","offer_id":52293494407448,"sku":"9780471493693","price":406.79,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780471493693.jpg?v=1781642414","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/x-ray-diffraction-procedures-for-polycrystalline-and-amorphous-materials-hardback-9780471493693","provider":"Freshly Printed Books","version":"1.0","type":"link"}