{"product_id":"surface-and-interface-analysis-principles-and-applications-paperback-softback-9781394218349","title":"Surface and Interface Analysis; Principles and Applications (Paperback \/ softback) 9781394218349","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eSurface and Interface Analysis\u003c\/font\u003e\u003cbr\u003e\r\n\u003cfont size=\"5\"\u003ePrinciples and Applications\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eSeong H. Kim (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9781394218349, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003ePaperback \/ softback, published 6 January 2025\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e416 pages\u003cbr\u003e27.4 x 21.6 x 3 cm, 0.953 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003e\u003cp\u003e\u003cb\u003eComprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces\u003c\/b\u003e \u003c\/p\u003e\n\u003cp\u003e\u003ci\u003eSurface and Interface Analysis\u003c\/i\u003e is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schrödinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach. \u003c\/p\u003e\n\u003cp\u003eWritten by a highly qualified professor, \u003ci\u003eSurface and Interface Analysis: Principles and Applications \u003c\/i\u003eincludes information on: \u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eRelationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, X-rays, and secondary ions emitted from the surface\u003c\/li\u003e \u003cli\u003eGovernance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interface\u003c\/li\u003e \u003cli\u003eSurface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentation\u003c\/li\u003e \u003cli\u003eArtifacts and misinterpretations that may be encountered during analysis\u003c\/li\u003e\n\u003c\/ul\u003e \u003cp\u003e\u003ci\u003eSurface and Interface Analysis\u003c\/i\u003e is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.\u003c\/p\u003e\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e\u003cp\u003ePreface xi\u003c\/p\u003e \u003cp\u003eAbout the Companion Website xv\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1 Introduction 1\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e1.1 Types of Surface Analysis 1\u003c\/p\u003e \u003cp\u003e1.2 Why Is Surface Analysis Done in Vacuum? 1\u003c\/p\u003e \u003cp\u003e1.3 Surface Energy 6\u003c\/p\u003e \u003cp\u003e1.4 Relationship Between Surface Energy and Physical Properties 8\u003c\/p\u003e \u003cp\u003e1.5 Measuring Surface Energy 10\u003c\/p\u003e \u003cp\u003e1.6 Bulk Properties Affected by Surface Energy 14\u003c\/p\u003e \u003cp\u003e1.7 Further Reading for Surface Contamination and Vacuum 16\u003c\/p\u003e \u003cp\u003ePractice Problems 16\u003c\/p\u003e \u003cp\u003eReferences 17\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2 Elemental Analysis via X-ray Irradiation 19\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1 Electron Emission upon X-ray Absorption 19\u003c\/p\u003e \u003cp\u003e2.2 Instrumentation for X-ray Photoelectron Spectroscopy (XPS) 27\u003c\/p\u003e \u003cp\u003e2.3 Qualitative Analysis with XPS 37\u003c\/p\u003e \u003cp\u003e2.4 Quantitative Analysis with XPS 48\u003c\/p\u003e \u003cp\u003e2.5 Depth Profiling with XPS 68\u003c\/p\u003e \u003cp\u003e2.6 Chemical Analysis with X-ray Absorption Spectroscopy (XAS) 73\u003c\/p\u003e \u003cp\u003e2.7 Further Reading for XPS 78\u003c\/p\u003e \u003cp\u003ePractice Problems 79\u003c\/p\u003e \u003cp\u003eReferences 84\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3 Elemental Analysis via Electron Irradiation 89\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.1 Principle of Auger Electron Spectroscopy (AES) 89\u003c\/p\u003e \u003cp\u003e3.2 Qualitative Analysis with AES 93\u003c\/p\u003e \u003cp\u003e3.3 Quantitative Analysis with AES 96\u003c\/p\u003e \u003cp\u003e3.4 Scanning Auger Mapping 97\u003c\/p\u003e \u003cp\u003e3.5 Further Reading for AES 99\u003c\/p\u003e \u003cp\u003ePractice Problems 100\u003c\/p\u003e \u003cp\u003eReferences 100\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4 Elemental Analysis via Ion Irradiation 103\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1 Principle of Secondary Ion Mass Spectrometry (SIMS) 103\u003c\/p\u003e \u003cp\u003e4.2 Qualitative Analysis with SIMS 106\u003c\/p\u003e \u003cp\u003e4.3 Quantitative Analysis with SIMS 111\u003c\/p\u003e \u003cp\u003e4.4 Further Reading for SIMS 112\u003c\/p\u003e \u003cp\u003ePractice Problems 112\u003c\/p\u003e \u003cp\u003eReferences 113\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5 Light Propagation, Absorption, and Reflection 115\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1 Propagation and Absorption of Electromagnetic Wave 116\u003c\/p\u003e \u003cp\u003e5.2 Reflection\/Refraction at Interface of Two Media 128\u003c\/p\u003e \u003cp\u003e5.3 Further Reading for IR and Raman Spectroscopy 139\u003c\/p\u003e \u003cp\u003ePractice Problems 139\u003c\/p\u003e \u003cp\u003eReferences 139\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6 Spectroscopic Analysis via IR Reflection and Transmission 141\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e6.1 Attenuated Total Reflectance Infrared (ATR-IR) Spectroscopy 143\u003c\/p\u003e \u003cp\u003e6.2 Specular Reflection Infrared (SR-IR) Spectroscopy 151\u003c\/p\u003e \u003cp\u003e6.3 Reflection Absorption Infrared Spectroscopy (RAIRS) 158\u003c\/p\u003e \u003cp\u003e6.4 Brewster-Angle Transmission (BAT) Infrared Spectroscopy 176\u003c\/p\u003e \u003cp\u003e6.5 Diffuse-Reflectance Infrared Fourier Transform (DRIFT) Spectroscopy 180\u003c\/p\u003e \u003cp\u003e6.6 IR Spectroscopic Imaging 183\u003c\/p\u003e \u003cp\u003e6.7 Further Reading for Surface-Sensitive IR Spectroscopy 192\u003c\/p\u003e \u003cp\u003ePractice Problems 192\u003c\/p\u003e \u003cp\u003eReferences 193\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7 Buried Interface Analysis via Nonlinear Spectroscopy 197\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e7.1 Nonlinear vs. Linear Optical Responses 197\u003c\/p\u003e \u003cp\u003e7.2 Sum Frequency Generation (SFG) Process 200\u003c\/p\u003e \u003cp\u003e7.3 SFG Spectroscopy Probing 2D Interface 211\u003c\/p\u003e \u003cp\u003e7.4 SFG Spectroscopy Probing Noncentrosymmetric Domains in 3D Bulk 233\u003c\/p\u003e \u003cp\u003e7.5 Further Reading for SFG 251\u003c\/p\u003e \u003cp\u003ePractice Problems 251\u003c\/p\u003e \u003cp\u003eReferences 253\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8 Multivariate Data Analysis 257\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e8.1 Least Squares Analysis 258\u003c\/p\u003e \u003cp\u003e8.2 Factor Analysis 261\u003c\/p\u003e \u003cp\u003e8.3 Matrix Algebra for Principal Component Analysis (PCA) and Principal Component Regression (PCR) 263\u003c\/p\u003e \u003cp\u003e8.4 Further Reading for Multivariate Analysis 281\u003c\/p\u003e \u003cp\u003ePractice Problems 281\u003c\/p\u003e \u003cp\u003eReferences 282\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9 Thin Film Analysis via Reflectometry and Ellipsometry 283\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e9.1 Recap of Light Reflection and Transmission Principles 283\u003c\/p\u003e \u003cp\u003e9.2 Reflectometry 285\u003c\/p\u003e \u003cp\u003e9.3 Ellipsometry 288\u003c\/p\u003e \u003cp\u003e9.4 Spectroscopic Ellipsometry (SE) 295\u003c\/p\u003e \u003cp\u003e9.5 Mueller Matrix Ellipsometry (MME) 306\u003c\/p\u003e \u003cp\u003e9.6 Further Reading for Ellipsometry 314\u003c\/p\u003e \u003cp\u003ePractice Problems 314\u003c\/p\u003e \u003cp\u003eReferences 315\u003c\/p\u003e \u003cp\u003e\u003cb\u003e10 Topography Analysis via Light Reflection 317\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e10.1 White Light Interferometry (WLI) 317\u003c\/p\u003e \u003cp\u003e10.2 Surface Roughness 326\u003c\/p\u003e \u003cp\u003e10.3 Further Reading of Optical Profilometry 328\u003c\/p\u003e \u003cp\u003ePractice Problems 328\u003c\/p\u003e \u003cp\u003eReferences 329\u003c\/p\u003e \u003cp\u003e\u003cb\u003e11 Topography Analysis via Scanning Probe 331\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e11.1 Tip–Sample Interactions in Atomic Force Microscopy (AFM) 331\u003c\/p\u003e \u003cp\u003e11.2 Force Measurement Through Cantilever Deflection 339\u003c\/p\u003e \u003cp\u003e11.3 Cantilever Oscillation in Noncontact and Tapping Mode AFM 341\u003c\/p\u003e \u003cp\u003e11.4 Surface Deformation in Contact Mode AFM 345\u003c\/p\u003e \u003cp\u003e11.5 Scanning AFM Probe 348\u003c\/p\u003e \u003cp\u003e11.6 Material Properties Measured Along with Topography 357\u003c\/p\u003e \u003cp\u003e11.7 Further Reading for AFM 362\u003c\/p\u003e \u003cp\u003ePractice Problems 362\u003c\/p\u003e \u003cp\u003eReferences 365\u003c\/p\u003e \u003cp\u003e\u003cb\u003e12 Mechanical Analysis via Indentation 369\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e12.1 Modulus, Hardness, and Toughness 369\u003c\/p\u003e \u003cp\u003e12.2 Nanoindentation 371\u003c\/p\u003e \u003cp\u003e12.3 Micro-indentation 375\u003c\/p\u003e \u003cp\u003e12.4 Hidden Factors Affecting Indentation Measurement 379\u003c\/p\u003e \u003cp\u003e12.5 Further Reading for Nanoindentation 388\u003c\/p\u003e \u003cp\u003ePractice Problems 388\u003c\/p\u003e \u003cp\u003eReferences 391\u003c\/p\u003e \u003cp\u003eIndex 393\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Mechanical engineering \u0026amp; materials [\u003ca title=\"See our other books on Mechanical engineering \u0026amp; materials\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Mechanical%20engineering%20\u0026amp;%20materials%20%5BTG%5D%22\"\u003eTG\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley","offers":[{"title":"Brand 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