{"product_id":"spectroscopic-ellipsometry-and-reflectometry-a-users-guide-hardback-9780471181729","title":"Spectroscopic Ellipsometry and Reflectometry; A User's Guide (Hardback) 9780471181729","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eSpectroscopic Ellipsometry and Reflectometry\u003c\/font\u003e\u003cbr\u003e\r\n\u003cfont size=\"5\"\u003eA User's Guide\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eHarland G. Tompkins (Author), William A. McGahan (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780471181729, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 6 April 1999\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e248 pages\u003cbr\u003e24 x 16 x 2 cm, 0.533 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eMit Hilfe der Ellipsometrie mißt man Dicken und optische Eigenschaften dünner Filme. In den vergangenen Jahren hat die ellipsometrische Spektroskopie ebenso wie die eng verwandte Reflektometrie zunehmend die Industrielabors erobert. Dies schafft Bedarf an einer praxisnahen Einführung für ein interdisziplinäres Publikum von Materialwissenschaftlern, Physikern, Chemikern und Elektrotechnikern, wie sie mit diesem Buch gelungen ist. (04\/99)\u003cbr\u003e \u003cbr\u003e\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003ePerspective and History.\u003cbr\u003e \u003cbr\u003e Fundamentals.\u003cbr\u003e \u003cbr\u003e Optical Properties of Materials and Layered Structures.\u003cbr\u003e \u003cbr\u003e Instrumentation.\u003cbr\u003e \u003cbr\u003e The Anatomy of a Reflectance Spectrum.\u003cbr\u003e \u003cbr\u003e Aspects of Single-Wavelength Ellipsometry.\u003cbr\u003e \u003cbr\u003e The Anatomy of an Ellipsometric Spectrum.\u003cbr\u003e \u003cbr\u003e Analytical Methods and Approach.\u003cbr\u003e \u003cbr\u003e Optical Data Analysis.\u003cbr\u003e \u003cbr\u003e Quality Assurance.\u003cbr\u003e \u003cbr\u003e Very Thin Films.\u003cbr\u003e \u003cbr\u003e Roughness.\u003cbr\u003e \u003cbr\u003e Appendices.\u003cbr\u003e \u003cbr\u003e Index.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Mechanical engineering \u0026amp; materials [\u003ca title=\"See our other books on Mechanical engineering \u0026amp; materials\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Mechanical%20engineering%20\u0026amp;%20materials%20%5BTG%5D%22\"\u003eTG\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-Interscience","offers":[{"title":"Brand New","offer_id":52286270603544,"sku":"9780471181729","price":110.99,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780471181729.jpg?v=1781548378","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/spectroscopic-ellipsometry-and-reflectometry-a-users-guide-hardback-9780471181729","provider":"Freshly Printed Books","version":"1.0","type":"link"}