{"product_id":"semiconductor-memories-technology-testing-and-reliability-hardback-9780780310001","title":"Semiconductor Memories; Technology, Testing, and Reliability (Hardback) 9780780310001","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eSemiconductor Memories\u003c\/font\u003e\u003cbr\u003e\r\n\u003cfont size=\"5\"\u003eTechnology, Testing, and Reliability\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eAshok K. Sharma (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780780310001, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 24 September 2002\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e480 pages\u003cbr\u003e25.7 x 18.3 x 3.3 cm, 1.043 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cem\u003e\u003cfont size=\"3\"\u003e\"...a valuable reference...\" (\u003ci\u003eMicroelectronics Reliability\u003c\/i\u003e, Vol. 43, 2003)\u003c\/font\u003e\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eSemiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.\u003cbr\u003e * Memory cell structures and fabrication technologies.\u003cbr\u003e * Application-specific memories and architectures.\u003cbr\u003e * Memory design, fault modeling and test algorithms, limitations, and trade-offs.\u003cbr\u003e * Space environment, radiation hardening process and design techniques, and radiation testing.\u003cbr\u003e * Memory stacks and multichip modules for gigabyte storage.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e\u003cb\u003ePreface.\u003c\/b\u003e  \u003cp\u003e\u003cb\u003eChapter 1: Introduction.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 2: Random Access Memory Technologies.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1 Introduction.\u003c\/p\u003e \u003cp\u003e2.2 Static Random Access Memories (SRAMs).\u003c\/p\u003e \u003cp\u003e2.3 Dynamic Random Access Memories (DRAMs).\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 3: Nonvolatile Memories.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.1 Introduction.\u003c\/p\u003e \u003cp\u003e3.2 Masked Read-Only Memories (ROMs).\u003c\/p\u003e \u003cp\u003e3.3 Programmable Read-Only Memories (PROMs).\u003c\/p\u003e \u003cp\u003e3.4 Erasable (UV)-Programmable Read-Only Memories (EPROMs).\u003c\/p\u003e \u003cp\u003e3.5 Electrically Erasable PROMs (EEPROMs).\u003c\/p\u003e \u003cp\u003e3.6 Flash Memories (EPROMs or EEPROMs).\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 4: Memory Fault Modeling and Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1 Introduction . . . .\u003c\/p\u003e \u003cp\u003e4.2 RAM Fault Modeling.\u003c\/p\u003e \u003cp\u003e4.3 RAM Electrical Testing.\u003c\/p\u003e \u003cp\u003e4.4 RAM Pseudorandom Testing.\u003c\/p\u003e \u003cp\u003e4.5 Megabit DRAM Testing.\u003c\/p\u003e \u003cp\u003e4.6 Nonvolatile Memory Modeling and Testing.\u003c\/p\u003e \u003cp\u003e4.7 IDDQ Fault Modeling and Testing.\u003c\/p\u003e \u003cp\u003e4.8 Application Specific Memory Testing.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 5: Memory Design for Testability and Fault Tolerance.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1 General Design for Testability Techniques.\u003c\/p\u003e \u003cp\u003e5.2 RAM Built-in Self-Test (BIST).\u003c\/p\u003e \u003cp\u003e5.3 Embedded Memory DFT and BIST Techniques.\u003c\/p\u003e \u003cp\u003e5.4 Advanced BIST and Built-in Self-Repair Architectures.\u003c\/p\u003e \u003cp\u003e5.5 DFT and BIST for ROMs.\u003c\/p\u003e \u003cp\u003e5.6 Memory Error-Detection and Correction Techniques.\u003c\/p\u003e \u003cp\u003e5.7 Memory Fault-Tolerance Designs.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 6: Semiconductor Memory Reliability.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e6.1 General Reliability Issues.\u003c\/p\u003e \u003cp\u003e6.2 RAM Failure Modes and Mechanisms.\u003c\/p\u003e \u003cp\u003e6.3 Nonvolatile Memory Reliability.\u003c\/p\u003e \u003cp\u003e6.4 Reliability Modeling and Failure Rate Prediction.\u003c\/p\u003e \u003cp\u003e6.5 Design for Reliability.\u003c\/p\u003e \u003cp\u003e6.6 Reliability Test Structures.\u003c\/p\u003e \u003cp\u003e6.7 Reliability Screening and Qualification.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 7: Semiconductor Memory Radiation Effects.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e7.1 Introduction.\u003c\/p\u003e \u003cp\u003e7.2 Radiation Effects.\u003c\/p\u003e \u003cp\u003e7.3 Radiation-Hardening Techniques.\u003c\/p\u003e \u003cp\u003e7.4 Radiation Hardness Assurance and Testing.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 8: Advanced Memory Technologies.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e8.1 Introduction.\u003c\/p\u003e \u003cp\u003e8.2 Ferroelectric Random Access Memories (FRAMs).\u003c\/p\u003e \u003cp\u003e8.3 Gallium Arsenide (GaAs) FRAMs.\u003c\/p\u003e \u003cp\u003e8.4 Analog Memories.\u003c\/p\u003e \u003cp\u003e8.5 Magnetoresistive Random Access Memories (MRAMs).\u003c\/p\u003e \u003cp\u003e8.6 Experimental Memory Devices.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 9: High-Density Memory Packaging Technologies.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e9.1 Introduction.\u003c\/p\u003e \u003cp\u003e9.2 Memory Hybrids and MCMs (2-D).\u003c\/p\u003e \u003cp\u003e9.3 Memory Stacks and MCMs (3-D).\u003c\/p\u003e \u003cp\u003e9.4 Memory MCM Testing and Reliability Issues.\u003c\/p\u003e \u003cp\u003e9.5 Memory Cards.\u003c\/p\u003e \u003cp\u003e9.6 High-Density Memory Packaging Future Directions.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eIndex.\u003c\/b\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-IEEE Press","offers":[{"title":"Brand New","offer_id":52501387608344,"sku":"9780780310001","price":148.99,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780780310001.jpg?v=1786234929","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/semiconductor-memories-technology-testing-and-reliability-hardback-9780780310001","provider":"Freshly Printed Books","version":"1.0","type":"link"}