{"product_id":"semiconductor-device-and-failure-analysis-using-photon-emission-microscopy-hardback-9780471492405","title":"Semiconductor Device and Failure Analysis; Using Photon Emission Microscopy (Hardback) 9780471492405","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eSemiconductor Device and Failure Analysis\u003c\/font\u003e\u003cbr\u003e\r\n\u003cfont size=\"5\"\u003eUsing Photon Emission Microscopy\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eWai Kin Chim (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780471492405, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 10 November 2000\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e288 pages\u003cbr\u003e23.6 x 16 x 2 cm, 0.539 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cem\u003e\u003cfont size=\"3\"\u003e\"This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure.\" (SciTech Book News Vol. 25, No. 2 June 2001)\u003c\/font\u003e\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eIntegrierte Schaltkreise werden immer komplexer - deshalb wird es zunehmend schwieriger, Fehler schnell und treffsicher aufzuspüren. Die Photonenemissionsmikroskopie (PEM) ist eine Analysetechnik auf physikalischer Grundlage, die sich als Fehlererkennungsmethode bewährt hat. Dieser Band erläutert alle Aspekte dieser Methode, von der instrumentellen Ausrüstung über spezifische Details der Mikroskope bis hin zu Merkmalen der Photonenemission unter verschiedenen Bedingungen. (11\/00)\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003ePreface.\u003cbr\u003e \u003cbr\u003e Introduction.\u003cbr\u003e \u003cbr\u003e Theory of Light Emission in Semiconductors.\u003cbr\u003e \u003cbr\u003e Instrumentation Aspects of the Photon Emission Microscope.\u003cbr\u003e \u003cbr\u003e Backside Photon Emission Microscopy.\u003cbr\u003e \u003cbr\u003e Spectroscopic Photon Emission Microscopy.\u003cbr\u003e \u003cbr\u003e Photon Emission from Metal-Oxide-Semiconductor Field-Effect Transistors under Hot-Carrier Stressing.\u003cbr\u003e \u003cbr\u003e Photon Emission from Metal-Oxide-Semiconductor Field-Effect Transistors under High-Field Impulse Stressing.\u003cbr\u003e \u003cbr\u003e Oxide Degradation and Photon Emission from Metal-Oxide Semiconductor Capacitor Structures.\u003cbr\u003e \u003cbr\u003e Index.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley","offers":[{"title":"Brand New","offer_id":52462970405144,"sku":"9780471492405","price":174.58,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780471492405.jpg?v=1785543908","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/semiconductor-device-and-failure-analysis-using-photon-emission-microscopy-hardback-9780471492405","provider":"Freshly Printed Books","version":"1.0","type":"link"}