{"product_id":"reflection-electron-microscopy-and-spectroscopy-for-surface-analysis-paperback-9780521017954","title":"Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Paperback) 9780521017954","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eReflection Electron Microscopy and Spectroscopy for Surface Analysis\u003c\/font\u003e\u003cbr\u003e\r\n\r\n\r\n\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003eA self-contained book on electron microscopy and spectrometry techniques for surface studies.\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eZhong Lin Wang (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780521017954, Cambridge University Press\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003ePaperback, published 22 August 2005\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e460 pages, 224 b\/w illus.  10 tables\u003cbr\u003e24.4 x 17 x 2.5 cm, 0.731 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cem\u003e\u003cfont size=\"3\"\u003e' … this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide\u003c\/font\u003e\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eIn this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e1. Kinematical electron diffraction\u003cbr\u003e Part I. Diffraction of Reflected Electrons: 2. Reflection high-energy electron diffraction\u003cbr\u003e 3. Dynamical theories of RHEED\u003cbr\u003e 4. Resonance reflections in RHEED\u003cbr\u003e Part II. Imaging of Reflected Electrons: 5. Imaging in TEM\u003cbr\u003e 6. Contrast mechanisms of reflected electron imaging\u003cbr\u003e 7. Applications of UHV REM\u003cbr\u003e 8. Applications of non-UHV REM\u003cbr\u003e Part III. Inelastic Scattering and Spectrometry of Reflected Electrons. 9. Phonon scattering in RHEED\u003cbr\u003e 10. Valence excitation in RHEED\u003cbr\u003e 11. Atomic inner-shell excitations in RHEED\u003cbr\u003e 12. Novel techniques associated with reflection electron imaging\u003cbr\u003e Appendix A. Physical constants, electron wavelengths and wave numbers\u003cbr\u003e Appendix B. Crystal inner potential and atomic scattering factor\u003cbr\u003e Appendix C.1. Crystallographic structure systems\u003cbr\u003e Appendix C.2. FORTRAN program for calculating crystallographic data\u003cbr\u003e Appendix D. Electron diffraction patterns of several types of crystals structures\u003cbr\u003e Appendix E. FORTRAN programs\u003cbr\u003e Appendix F. Bibliography of REM, SREM and REELS\u003cbr\u003e References.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Materials science [\u003ca title=\"See our other books on Materials science\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Materials%20science%20%5BTGM%5D%22\"\u003eTGM\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Cambridge University Press","offers":[{"title":"Default Title","offer_id":46006153216280,"sku":"9780521017954","price":47.39,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/products\/9780521017954i_99408d27-a1d5-4ebb-97a6-5bbbf83c8520.jpg?v=1691376743","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/reflection-electron-microscopy-and-spectroscopy-for-surface-analysis-paperback-9780521017954","provider":"Freshly Printed Books","version":"1.0","type":"link"}