{"product_id":"optical-shop-testing-hardback-9780471484042","title":"Optical Shop Testing (Hardback) 9780471484042","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eOptical Shop Testing\u003c\/font\u003e\u003cbr\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003c\/p\u003e\n\u003cp\u003e\u003cfont size=\"4\"\u003eDaniel Malacara (Edited by), D Malacara (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780471484042, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 27 July 2007\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e896 pages\u003cbr\u003e24.6 x 16.3 x 5.3 cm, 1.433 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cem\u003e\u003cfont size=\"3\"\u003e\"This book is a major text in the field, and a must-read for academicians and engineers alike.\" (\u003ci\u003eComputing Reviews\u003c\/i\u003e, May 1, 2008)\u003c\/font\u003e\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eThe purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e\u003cp\u003ePreface xvii\u003c\/p\u003e \u003cp\u003eContributors xix\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 1. Newton, Fizeau, and Haidinger Interferometers 1 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eM. V. Mantravadi and D. Malacara\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e1.1. Introduction 1\u003c\/p\u003e \u003cp\u003e1.2. Newton Interferometer 1\u003c\/p\u003e \u003cp\u003e1.2.1. Source and Observer’s Pupil Size Considerations 9\u003c\/p\u003e \u003cp\u003e1.2.2. Some Suitable Light Sources 11\u003c\/p\u003e \u003cp\u003e1.2.3. Materials for the Optical Flats 12\u003c\/p\u003e \u003cp\u003e1.2.4. Simple Procedure for Estimating Peak Error 12\u003c\/p\u003e \u003cp\u003e1.2.5. Measurement of Spherical Surfaces 13\u003c\/p\u003e \u003cp\u003e1.2.6. Measurement of Aspheric Surfaces 15\u003c\/p\u003e \u003cp\u003e1.2.7. Measurement of Flatness of Opaque Surfaces 17\u003c\/p\u003e \u003cp\u003e1.3. Fizeau Interferometer 17\u003c\/p\u003e \u003cp\u003e1.3.1. The Basic Fizeau Interferometer 18\u003c\/p\u003e \u003cp\u003e1.3.2. Coherence Requirements for the Light Source 20\u003c\/p\u003e \u003cp\u003e1.3.3. Quality of Collimation Lens Required 22\u003c\/p\u003e \u003cp\u003e1.3.4. Liquid Reference Flats 23\u003c\/p\u003e \u003cp\u003e1.3.5. Fizeau Interferometer with Laser Source 23\u003c\/p\u003e \u003cp\u003e1.3.6. Multiple-Beam Fizeau Setup 24\u003c\/p\u003e \u003cp\u003e1.3.7. Testing Nearly Parallel Plates 26\u003c\/p\u003e \u003cp\u003e1.3.8. Testing the Inhomogeneity of Large Glass or Fused Quartz Samples 27\u003c\/p\u003e \u003cp\u003e1.3.9. Testing the Parallelism and Flatness of the Faces of Rods, Bars and Plates 28\u003c\/p\u003e \u003cp\u003e1.3.10. Testing Cube Corner and Right-Angle Prisms 28\u003c\/p\u003e \u003cp\u003e1.3.11. Fizeau Interferometer for Curved Surfaces 30\u003c\/p\u003e \u003cp\u003e1.3.12. Testing Concave and Convex Surfaces 32\u003c\/p\u003e \u003cp\u003e1.4. Haldinger Interferometer 33\u003c\/p\u003e \u003cp\u003e1.4.1. Applications of Haidinger Fringes 35\u003c\/p\u003e \u003cp\u003e1.4.2. Use of Laser Source for Haidinger Interferometer 36\u003c\/p\u003e \u003cp\u003e1.4.3. Other Applications of Haidinger Fringes 39\u003c\/p\u003e \u003cp\u003e1.5. Absolute Testing of Flats 40\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 2. Twyman–Green Interferometer 46 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eD. Malacara\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e2.1. Introduction 46\u003c\/p\u003e \u003cp\u003e2.2. Beam-Splitter 48\u003c\/p\u003e \u003cp\u003e2.2.1. Optical Path Difference Introduced by the Beam Splitter Plate 49\u003c\/p\u003e \u003cp\u003e2.2.2. Required Accuracy in the Beam Splitter Plate 51\u003c\/p\u003e \u003cp\u003e2.2.3. Polarizing Cube Beam Splitter 53\u003c\/p\u003e \u003cp\u003e2.2.4. Nonpolarizing Cube Beam Splitter 55\u003c\/p\u003e \u003cp\u003e2.3. Coherence Requirements 56\u003c\/p\u003e \u003cp\u003e2.3.1. Spatial Coherence 56\u003c\/p\u003e \u003cp\u003e2.3.2. Temporal Coherence 60\u003c\/p\u003e \u003cp\u003e2.4. Uses of a Twyman–Green Interferometer 62\u003c\/p\u003e \u003cp\u003e2.4.1. Testing of Prisms and Diffraction Rulings 64\u003c\/p\u003e \u003cp\u003e2.4.2. Testing of Lenses 69\u003c\/p\u003e \u003cp\u003e2.4.3. Testing of Microscope Objectives 71\u003c\/p\u003e \u003cp\u003e2.5. Compensation of Intrinsic Aberrations in the Interferometer 72\u003c\/p\u003e \u003cp\u003e2.6. Unequal-Path Interferometer 73\u003c\/p\u003e \u003cp\u003e2.6.1. Some Special Designs 75\u003c\/p\u003e \u003cp\u003e2.6.2. Improving the Fringe Stability 76\u003c\/p\u003e \u003cp\u003e2.7. Open Path Interferometers 77\u003c\/p\u003e \u003cp\u003e2.7.1. Mach-Zehnder Interferometers 77\u003c\/p\u003e \u003cp\u003e2.7.2. Oblique Incidence Interferometers 78\u003c\/p\u003e \u003cp\u003e2.8. Variations from the Twyman–Green Configuration 80\u003c\/p\u003e \u003cp\u003e2.8.1. Multiple Image Interferometers 80\u003c\/p\u003e \u003cp\u003e2.8.2. Interferometers with Diffractive Beam Splitters 80\u003c\/p\u003e \u003cp\u003e2.8.3. Phase Conjugating Interferometer 81\u003c\/p\u003e \u003cp\u003e2.9. Twyman–Green Interferograms and their Analysis 83\u003c\/p\u003e \u003cp\u003e2.9.1. Analysis of Interferograms of Arbitrary Wavefronts 91\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 3. Common-Path Interferometers 97 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eS. Mallick and D. Malacara\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e3.1. Introduction 97\u003c\/p\u003e \u003cp\u003e3.2. Burch’s Interferometer Employing Two Matched Scatter Plates 98\u003c\/p\u003e \u003cp\u003e3.2.1. Fresnel Zone Plate Interferometer 102\u003c\/p\u003e \u003cp\u003e3.2.2. Burch and Fresnel Zone Plate Interferometers for Aspheric Surfaces 102\u003c\/p\u003e \u003cp\u003e3.2.3. Burch and Fresnel Zone Plate Interferometers for Phase Shifting 102\u003c\/p\u003e \u003cp\u003e3.3. Birefringent Beam Splitters 104\u003c\/p\u003e \u003cp\u003e3.3.1. Savart Polariscope 104\u003c\/p\u003e \u003cp\u003e3.3.2. Wollaston Prism 106\u003c\/p\u003e \u003cp\u003e3.3.3. Double-Focus Systems 107\u003c\/p\u003e \u003cp\u003e3.4. Lateral Shearing Interferometers 108\u003c\/p\u003e \u003cp\u003e3.4.1. Use of a Savart Polariscope 108\u003c\/p\u003e \u003cp\u003e3.4.2. Use of a Wollaston Prism 111\u003c\/p\u003e \u003cp\u003e3.5. Double-Focus Interferometer 112\u003c\/p\u003e \u003cp\u003e3.6. Saunders’s Prism Interferometer 114\u003c\/p\u003e \u003cp\u003e3.7. Point Diffraction Interferometer 116\u003c\/p\u003e \u003cp\u003e3.8. Zernike Tests with Common-Path Interferometers 118\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 4. Lateral Shear Interferometers 122 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eStrojnik, G. Paez, and M. Mantravadi\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e4.1. Introduction 122\u003c\/p\u003e \u003cp\u003e4.2. Coherence Properties of the Light Source 123\u003c\/p\u003e \u003cp\u003e4.3. Brief Theory of Lateral Shearing Interferometry 124\u003c\/p\u003e \u003cp\u003e4.3.1. Interferograms of Spherical and Flat Wavefronts 126\u003c\/p\u003e \u003cp\u003e4.3.2. Interferogams of Primary Aberrations upon Lateral Shear 128\u003c\/p\u003e \u003cp\u003e4.4. Evaluation of an Unknown Wavefront 134\u003c\/p\u003e \u003cp\u003e4.5. Lateral Shearing Interferometers in Collimated Light (White Light Compensated) 137\u003c\/p\u003e \u003cp\u003e4.5.1. Arrangements Based on the Jamin Interferometer 137\u003c\/p\u003e \u003cp\u003e4.5.2. Arrangements Based on the Michelson Interferometer 139\u003c\/p\u003e \u003cp\u003e4.5.3. Arrangements Based on a Cyclic Interferometer 140\u003c\/p\u003e \u003cp\u003e4.5.4. Arrangements Based on the Mach–Zehnder Interferometer 142\u003c\/p\u003e \u003cp\u003e4.6. Lateral Shearing Interferometers in Convergent Light (White Light Compensated) 143\u003c\/p\u003e \u003cp\u003e4.6.1. Arrangements Based on the Michelson Interferometer 143\u003c\/p\u003e \u003cp\u003e4.6.2. Arrangements Based on the Mach–Zehnder Interferometer 146\u003c\/p\u003e \u003cp\u003e4.7. Lateral Shearing Interferometers Using Lasers 149\u003c\/p\u003e \u003cp\u003e4.7.1. Other Applications of the Plane Parallel Plate Interferometer 152\u003c\/p\u003e \u003cp\u003e4.8. Other Types of Lateral Shearing Interferometers 157\u003c\/p\u003e \u003cp\u003e4.8.1. Lateral Shearing Interferometers Based on Diffraction 158\u003c\/p\u003e \u003cp\u003e4.8.2. Lateral Shearing Interferometers Based on Polarization 162\u003c\/p\u003e \u003cp\u003e4.9. Vectorial Shearing Interferometer 164\u003c\/p\u003e \u003cp\u003e4.9.1. Shearing Interferometry 165\u003c\/p\u003e \u003cp\u003e4.9.2. Directional Shearing Interferometer 166\u003c\/p\u003e \u003cp\u003e4.9.3. Simulated Interferometric Patterns 168\u003c\/p\u003e \u003cp\u003e4.9.4. Experimental Results 173\u003c\/p\u003e \u003cp\u003e4.9.5. Similarities and Differences With Other Interferometers 176\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 5. Radial, Rotational, and Reversal Shear Interferometer 185 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eD. Malacara\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e5.1. Introduction 185\u003c\/p\u003e \u003cp\u003e5.2. Radial Shear Interferometers 187\u003c\/p\u003e \u003cp\u003e5.2.1. Wavefront Evaluation from Radial Shear Interferograms 189\u003c\/p\u003e \u003cp\u003e5.2.2. Single-Pass Radial Shear Interferometers 190\u003c\/p\u003e \u003cp\u003e5.2.3. Double-Pass Radial Shear Interferometers 195\u003c\/p\u003e \u003cp\u003e5.2.4. Laser Radial Shear Interferometers 197\u003c\/p\u003e \u003cp\u003e5.2.5. Thick-Lens Radial Shear Interferometers 202\u003c\/p\u003e \u003cp\u003e5.3. Rotational Shear Interferometers 204\u003c\/p\u003e \u003cp\u003e5.3.1. Source Size Uncompensated Rotational Shear Interferometers 207\u003c\/p\u003e \u003cp\u003e5.3.2. Source Size Compensated Rotational Shear Interferometers 211\u003c\/p\u003e \u003cp\u003e5.4. Reversal Shear Interferometers 211\u003c\/p\u003e \u003cp\u003e5.4.1. Some Reversal Shear Interferometers 213\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 6. Multiple-Beam Interferometers 219 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eC. Roychoudhuri\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e6.1. Brief Historical Introduction 219\u003c\/p\u003e \u003cp\u003e6.2. Precision in Multiple-Beam Interferometry 221\u003c\/p\u003e \u003cp\u003e6.3. Multiple-Beam Fizeau Interferometer 224\u003c\/p\u003e \u003cp\u003e6.3.1. Conditions for Fringe Formation 224\u003c\/p\u003e \u003cp\u003e6.3.2. Fizeau Interferometry 229\u003c\/p\u003e \u003cp\u003e6.4. Fringes of Equal Chromatic Order 232\u003c\/p\u003e \u003cp\u003e6.5. Reduction of Fringe Interval in Multiple-Beam Interferometry 235\u003c\/p\u003e \u003cp\u003e6.6. Plane Parallel Fabry–Perot Interferometer 236\u003c\/p\u003e \u003cp\u003e6.6.1. Measurement of Thin-Film Thickness 236\u003c\/p\u003e \u003cp\u003e6.6.2. Surface Deviation from Planeness 237\u003c\/p\u003e \u003cp\u003e6.7. Tolansky Fringes with Fabry–Perot Interferometer 241\u003c\/p\u003e \u003cp\u003e6.8. Multiple-Beam Interferometer for Curved Surfaces 243\u003c\/p\u003e \u003cp\u003e6.9. Coupled and Series Interferometers 244\u003c\/p\u003e \u003cp\u003e6.9.1. Coupled Interferometer 245\u003c\/p\u003e \u003cp\u003e6.9.2. Series Interferometer 246\u003c\/p\u003e \u003cp\u003e6.10. Holographic Multiple-Beam Interferometers 247\u003c\/p\u003e \u003cp\u003e6.11. Temporal Evolution of FP Fringes and Its Modern Applications 247\u003c\/p\u003e \u003cp\u003e6.12. Final Comments 250\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 7. Multiple-Pass Interferometers 259 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eP. Hariharan\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e7.1. Double-Pass Interferometers 259\u003c\/p\u003e \u003cp\u003e7.1.1. Separation of Aberrations 259\u003c\/p\u003e \u003cp\u003e7.1.2. Reduction of Coherence Requirements 262\u003c\/p\u003e \u003cp\u003e7.1.3. Double Passing for Increased Accuracy 264\u003c\/p\u003e \u003cp\u003e7.2. Multipass Interferometry 266\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 8. Foucault, Wire, and Phase Modulation Tests 275 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eJ. Ojeda-Castan˜eda\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e8.1. Introduction 275\u003c\/p\u003e \u003cp\u003e8.2. Foucault or Knife-Edge Test 275\u003c\/p\u003e \u003cp\u003e8.2.1. Description 275\u003c\/p\u003e \u003cp\u003e8.2.2. Geometrical Theory 280\u003c\/p\u003e \u003cp\u003e8.2.3. Physical Theory 289\u003c\/p\u003e \u003cp\u003e8.3. Wire Test 293\u003c\/p\u003e \u003cp\u003e8.3.1. Geometrical Theory 297\u003c\/p\u003e \u003cp\u003e8.4. Platzeck–Gaviola Test 298\u003c\/p\u003e \u003cp\u003e8.4.1. Geometrical Theory 299\u003c\/p\u003e \u003cp\u003e8.5. Phase Modulation Tests 302\u003c\/p\u003e \u003cp\u003e8.5.1. Zernike Test and its Relation to the Smart Interferometer 302\u003c\/p\u003e \u003cp\u003e8.5.2. Lyot Test 305\u003c\/p\u003e \u003cp\u003e8.5.3. Wolter Test 307\u003c\/p\u003e \u003cp\u003e8.6. Ritchey–Common Test 310\u003c\/p\u003e \u003cp\u003e8.7. Conclusions 313\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 9. Ronchi Test 317 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eA. Cornejo-Rodriguez\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e9.1. Introduction 317\u003c\/p\u003e \u003cp\u003e9.1.1. Historical Introduction 317\u003c\/p\u003e \u003cp\u003e9.2. Geometrical Theory 318\u003c\/p\u003e \u003cp\u003e9.2.1. Ronchi Patterns for Primary Aberrations 320\u003c\/p\u003e \u003cp\u003e9.2.2. Ronchi Patterns for Aspherical Surfaces 327\u003c\/p\u003e \u003cp\u003e9.2.3. Null Ronchi Rulings 328\u003c\/p\u003e \u003cp\u003e9.3. Wavefront Shape Determination 331\u003c\/p\u003e \u003cp\u003e9.3.1. General Case 333\u003c\/p\u003e \u003cp\u003e9.3.2. Surfaces with Rotational Symmetry 335\u003c\/p\u003e \u003cp\u003e9.4. Physical Theory 337\u003c\/p\u003e \u003cp\u003e9.4.1. Mathematical Treatment 337\u003c\/p\u003e \u003cp\u003e9.4.2. Fringe Contrast and Sharpness 340\u003c\/p\u003e \u003cp\u003e9.4.3. Physical versus Geometrical Theory 343\u003c\/p\u003e \u003cp\u003e9.5. Practical Aspects of the Ronchi Test 344\u003c\/p\u003e \u003cp\u003e9.6. Some Related Tests 347\u003c\/p\u003e \u003cp\u003e9.6.1. Concentric Circular Grid 347\u003c\/p\u003e \u003cp\u003e9.6.2. Phase Shifting Ronchi Test 348\u003c\/p\u003e \u003cp\u003e9.6.3. Sideband Ronchi Test 348\u003c\/p\u003e \u003cp\u003e9.6.4. Lower Test 349\u003c\/p\u003e \u003cp\u003e9.6.5. Ronchi–Hartmann and Null Hartmann Tests 350\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 10. Hartmann, Hartmann–Shack, and Other Screen Tests 361 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eD. Malacara-Doblado and I. Ghozeil\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e10.1. Introduction 361\u003c\/p\u003e \u003cp\u003e10.2. Some Practical Aspects 363\u003c\/p\u003e \u003cp\u003e10.3. Hartmann Test Using a Rectangular Screen 366\u003c\/p\u003e \u003cp\u003e10.4. Wavefront Retrieval 368\u003c\/p\u003e \u003cp\u003e10.4.1. Tilt and Defocus Removal 368\u003c\/p\u003e \u003cp\u003e10.4.2. Trapezoidal Integration 370\u003c\/p\u003e \u003cp\u003e10.4.3. Southwell Algorithm 373\u003c\/p\u003e \u003cp\u003e10.4.4. Polynomial Fitting 374\u003c\/p\u003e \u003cp\u003e10.4.5. Other Methods 375\u003c\/p\u003e \u003cp\u003e10.5. Hartmann Test Using a Screen with Four Holes 376\u003c\/p\u003e \u003cp\u003e10.5.1. Four Holes in Cross 377\u003c\/p\u003e \u003cp\u003e10.5.2. Four Holes in X 378\u003c\/p\u003e \u003cp\u003e10.6. Hartmann Test of Ophthalmic Lenses 379\u003c\/p\u003e \u003cp\u003e10.7. Hartmann Test Using Nonrectangular Screens 379\u003c\/p\u003e \u003cp\u003e10.7.1. Radial Screen 380\u003c\/p\u003e \u003cp\u003e10.7.2. Helical Screen 382\u003c\/p\u003e \u003cp\u003e10.8. Hartmann–Shack Test 383\u003c\/p\u003e \u003cp\u003e10.9. Crossed Cylinder Test 386\u003c\/p\u003e \u003cp\u003e10.10. Testing with an Array of Light Sources or Printed Screens 387\u003c\/p\u003e \u003cp\u003e10.10.1. Testing Convergent Lenses 388\u003c\/p\u003e \u003cp\u003e10.10.2. Testing Concave and Convex Surfaces 389\u003c\/p\u003e \u003cp\u003e10.11. Michelson–Gardner–Bennett Tests 393\u003c\/p\u003e \u003cp\u003e10.12. Other Developments 394\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 11. Star Tests 398 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eD. Malacara and W. T. Welford\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e11.1. Introduction 398\u003c\/p\u003e \u003cp\u003e11.2. Star Test with Small Aberrations 399\u003c\/p\u003e \u003cp\u003e11.2.1. The Aberration Free Airy Pattern 400\u003c\/p\u003e \u003cp\u003e11.2.2. The Defocused Airy Pattern 403\u003c\/p\u003e \u003cp\u003e11.2.3. Polychromatic Light 405\u003c\/p\u003e \u003cp\u003e11.2.4. Systems with Central Obstructions 407\u003c\/p\u003e \u003cp\u003e11.2.5. Effects of Small Aberrations 408\u003c\/p\u003e \u003cp\u003e11.2.6. Gaussian Beams 409\u003c\/p\u003e \u003cp\u003e11.2.7. Very Small Convergence Angles (Low Fresnel Numbers) 409\u003c\/p\u003e \u003cp\u003e11.3. Practical Aspects with Small Aberrations 410\u003c\/p\u003e \u003cp\u003e11.3.1. Effects of Visual Star Testing 410\u003c\/p\u003e \u003cp\u003e11.3.2. The Light Source for Star Testing 412\u003c\/p\u003e \u003cp\u003e11.3.3. The Arrangement of the Optical System for Star Testing 413\u003c\/p\u003e \u003cp\u003e11.3.4. Microscope Objectives 415\u003c\/p\u003e \u003cp\u003e11.4. The Star Test with Large Aberrations 416\u003c\/p\u003e \u003cp\u003e11.4.1. Spherical Aberration 417\u003c\/p\u003e \u003cp\u003e11.4.2. Longitudinal Chromatic Aberration 418\u003c\/p\u003e \u003cp\u003e11.4.3. Axial Symmetry 418\u003c\/p\u003e \u003cp\u003e11.4.4. Astigmatism and Coma 419\u003c\/p\u003e \u003cp\u003e11.4.5. Distortion 419\u003c\/p\u003e \u003cp\u003e11.4.6. Non-Null Tests 420\u003c\/p\u003e \u003cp\u003e11.5. Wavefront Retrieval with Slope and Curvature Measurements 421\u003c\/p\u003e \u003cp\u003e11.5.1. The Laplacian and Local Average Curvatures 421\u003c\/p\u003e \u003cp\u003e11.5.2. Wavefront Determination with Iterative Fourier Transforms 422\u003c\/p\u003e \u003cp\u003e11.5.3. Irradiance Transport Equation 425\u003c\/p\u003e \u003cp\u003e11.6. Wavefront Determination with Two Images Using the Irradiance Transport Equation 426\u003c\/p\u003e \u003cp\u003e11.7. Wavefront Determination with a Single Defocused Image Using Fourier Transform Iterations 429\u003c\/p\u003e \u003cp\u003e11.8. Wavefront Determination with Two or Three Defocused Images Using Fresnel Transform Iterations 430\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 12. Testing of Aspheric Wavefronts and Surfaces 435 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eD. Malacara, K. Creath, J. Schmit and J. C. Wyant\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e12.1. Introduction 435\u003c\/p\u003e \u003cp\u003e12.2 Some Methods to Test Aspheric Wavefronts 437\u003c\/p\u003e \u003cp\u003e12.3. Imaging of the Interference Pattern in Non-Null Tests 439\u003c\/p\u003e \u003cp\u003e12.4. Some Null Testing Configurations 442\u003c\/p\u003e \u003cp\u003e12.4.1. Flat and Concave Spherical Surfaces 442\u003c\/p\u003e \u003cp\u003e12.4.2. Telescope Refracting Objectives 442\u003c\/p\u003e \u003cp\u003e12.4.3. Concave Paraboloidal Surfaces 443\u003c\/p\u003e \u003cp\u003e12.4.4. Concave Ellipsoidal or Spheroidal Surfaces 444\u003c\/p\u003e \u003cp\u003e12.5. Testing of Convex Hyperboloidal Surfaces 445\u003c\/p\u003e \u003cp\u003e12.5.1. Hindle Type Tests 445\u003c\/p\u003e \u003cp\u003e12.5.2. Testing by Refraction 449\u003c\/p\u003e \u003cp\u003e12.6. Testing of Cylindrical Surfaces 453\u003c\/p\u003e \u003cp\u003e12.7. Early Compensators 454\u003c\/p\u003e \u003cp\u003e12.7.1. Couder, Burch, and Ross Compensators 456\u003c\/p\u003e \u003cp\u003e12.7.2. Dall Compensator 458\u003c\/p\u003e \u003cp\u003e12.8. Refractive Compensators 461\u003c\/p\u003e \u003cp\u003e12.8.1. Refractive Offner Compensator 462\u003c\/p\u003e \u003cp\u003e12.8.2. Shafer Compensator 464\u003c\/p\u003e \u003cp\u003e12.8.3. General Comments about Refracting Compensators 465\u003c\/p\u003e \u003cp\u003e12.9. Reflecting Compensators 466\u003c\/p\u003e \u003cp\u003e12.9.1. Reflective Offner Compensators 468\u003c\/p\u003e \u003cp\u003e12.9.2. Reflective Adaptive Compensator 471\u003c\/p\u003e \u003cp\u003e12.10. Other Compensators for Concave Conicoids 471\u003c\/p\u003e \u003cp\u003e12.11. Interferometers Using Real Holograms 474\u003c\/p\u003e \u003cp\u003e12.11.1. Holographic Wavefront Storage 476\u003c\/p\u003e \u003cp\u003e12.11.2. Holographic Test Plate 476\u003c\/p\u003e \u003cp\u003e12.12. Interferometers Using Synthetic Holograms 477\u003c\/p\u003e \u003cp\u003e12.12.1. Fabrication of Computer-Generated Holograms (CGHs) 478\u003c\/p\u003e \u003cp\u003e12.12.2. Using a CGH in an Interferometer 480\u003c\/p\u003e \u003cp\u003e12.12.3. Off-Axis CGH Aspheric Compensator 483\u003c\/p\u003e \u003cp\u003e12.12.4. In-Line CGH Aspheric Compensator 485\u003c\/p\u003e \u003cp\u003e12.12.5. Combination of CGH with Null Optics 486\u003c\/p\u003e \u003cp\u003e12.13. Aspheric Testing with Two-Wavelength Holography 488\u003c\/p\u003e \u003cp\u003e12.14. Wavefront Stitching 491\u003c\/p\u003e \u003cp\u003e12.14.1. Annular Zones 491\u003c\/p\u003e \u003cp\u003e12.14.2. Circular Zones 493\u003c\/p\u003e \u003cp\u003e12.14.3. Dynamic Tilt Switching 493\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 13. Zernike Polynomial and Wavefront Fitting 498 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eVirendra N. Mahajan\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e13.1. Introduction 498\u003c\/p\u003e \u003cp\u003e13.2. Aberrations of a Rotationally Symmetric System with a Circular Pupil 499\u003c\/p\u003e \u003cp\u003e13.2.1. Power Series Expansion 499\u003c\/p\u003e \u003cp\u003e13.2.2. Primary or Seidel Aberration Function 501\u003c\/p\u003e \u003cp\u003e13.2.3. Secondary or Schwarzschild Aberration Function 504\u003c\/p\u003e \u003cp\u003e13.2.4. Zernike Circle Polynomial Expansion 505\u003c\/p\u003e \u003cp\u003e13.2.5. Zernike Circle Polynomials as Balanced Aberrations for Minimum Wave Aberration Variance 508\u003c\/p\u003e \u003cp\u003e13.2.6. Relationships Between Coefficients of Power-Series and Zernike-Polynomial Expansions 510\u003c\/p\u003e \u003cp\u003e13.2.7. Conversion of Seidel Aberrations into Zernike Aberrations 513\u003c\/p\u003e \u003cp\u003e13.2.8. Conversion of Zernike Aberrations into Seidel Aberrations 515\u003c\/p\u003e \u003cp\u003e13.3. Aberration Function of a System with a Circular Pupil, but Without an Axis of Rotational Symmetry 516\u003c\/p\u003e \u003cp\u003e13.3.1. Zernike Circle Polynomial Expansion 516\u003c\/p\u003e \u003cp\u003e13.3.2. Relationships Among the Indices n, m, and j 518\u003c\/p\u003e \u003cp\u003e13.3.3. Isometric, Interferometric, and PSF Plots for a Zernike Circle Polynomial Aberration 520\u003c\/p\u003e \u003cp\u003e13.3.4. Primary Zernike Aberrations and Their Relationships with Seidel Aberrations 521\u003c\/p\u003e \u003cp\u003e13.4. Zernike Annular Polynomials as Balanced Aberrations for Systems with Annular Pupils 525\u003c\/p\u003e \u003cp\u003e13.4.1. Balanced Aberrations 525\u003c\/p\u003e \u003cp\u003e13.4.2. Zernike Annular Polynomials 525\u003c\/p\u003e \u003cp\u003e13.4.3. Isometric, Interferometric, and PSF Plots for a Zernike Annular Polynomial Aberration 529\u003c\/p\u003e \u003cp\u003e13.5. Determination of Zernike Coefficients From Discrete Wavefront Error Data 530\u003c\/p\u003e \u003cp\u003e13.5.1. Introduction 530\u003c\/p\u003e \u003cp\u003e13.5.2. Orthonormal Coefficients and Aberration Variance 535\u003c\/p\u003e \u003cp\u003e13.5.3. Orthonormal Polynomials 537\u003c\/p\u003e \u003cp\u003e13.5.4. Zernike Coefficients 538\u003c\/p\u003e \u003cp\u003e13.5.5. Numerical Example 539\u003c\/p\u003e \u003cp\u003e13.6. Summary 543\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 14. Phase Shifting Interferometry 547 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eHorst Schreiber and John H. Bruning\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e14.1. Introduction 547\u003c\/p\u003e \u003cp\u003e14.2. Fundamental Concepts 548\u003c\/p\u003e \u003cp\u003e14.3. Advantages of PSI 550\u003c\/p\u003e \u003cp\u003e14.4. Methods of Phase Shifting 552\u003c\/p\u003e \u003cp\u003e14.5. Detecting the Wavefront Phase 557\u003c\/p\u003e \u003cp\u003e14.6. Data Collection 560\u003c\/p\u003e \u003cp\u003e14.6.1. Temporal Methods 560\u003c\/p\u003e \u003cp\u003e14.6.2. Spatial Methods 564\u003c\/p\u003e \u003cp\u003e14.7. PSI Algorithms 568\u003c\/p\u003e \u003cp\u003e14.7.1. Three Step Algorithms 569\u003c\/p\u003e \u003cp\u003e14.7.2. Least-Squares Algorithms 571\u003c\/p\u003e \u003cp\u003e14.7.3. Carre´ Algorithm 574\u003c\/p\u003e \u003cp\u003e14.7.4. Family of Averaging Algorithms 576\u003c\/p\u003e \u003cp\u003e14.7.5. Hariharan Algorithm 577\u003c\/p\u003e \u003cp\u003e14.7.6. 2 þ 1 Algorithm 580\u003c\/p\u003e \u003cp\u003e14.7.7. Methods to Generate Algorithms 582\u003c\/p\u003e \u003cp\u003e14.7.8. Methods to Evaluate Algorithms 586\u003c\/p\u003e \u003cp\u003e14.7.9. Summary of Algorithms 591\u003c\/p\u003e \u003cp\u003e14.8. Phase Shift Calibration 596\u003c\/p\u003e \u003cp\u003e14.9. Error Sources 599\u003c\/p\u003e \u003cp\u003e14.9.1. Phase Shift Errors 600\u003c\/p\u003e \u003cp\u003e14.9.2. Detector Nonlinearities 602\u003c\/p\u003e \u003cp\u003e14.9.3. Source Stability 605\u003c\/p\u003e \u003cp\u003e14.9.4. Quantization Errors 606\u003c\/p\u003e \u003cp\u003e14.9.5. Vibration Errors 607\u003c\/p\u003e \u003cp\u003e14.9.6. Air Turbulence 610\u003c\/p\u003e \u003cp\u003e14.9.7. Extraneous Fringes and Other Coherent Effects 610\u003c\/p\u003e \u003cp\u003e14.9.8. Interferometer Optical Errors 611\u003c\/p\u003e \u003cp\u003e14.10. Detectors and Spatial Sampling 613\u003c\/p\u003e \u003cp\u003e14.10.1. Solid State Sensors 613\u003c\/p\u003e \u003cp\u003e14.10.2. Spatial Sampling 614\u003c\/p\u003e \u003cp\u003e14.11. Quality Functions 617\u003c\/p\u003e \u003cp\u003e14.11.1. Modulation 618\u003c\/p\u003e \u003cp\u003e14.11.2. Residues 619\u003c\/p\u003e \u003cp\u003e14.11.3. Filtering 622\u003c\/p\u003e \u003cp\u003e14.12. Phase Unwrapping 623\u003c\/p\u003e \u003cp\u003e14.12.1. Unwrapping in One Dimension 623\u003c\/p\u003e \u003cp\u003e14.12.2. 2-D Phase Unwrapping 625\u003c\/p\u003e \u003cp\u003e14.12.3. Path-Following Algorithms 626\u003c\/p\u003e \u003cp\u003e14.12.4. Path Independent Methods 628\u003c\/p\u003e \u003cp\u003e14.13. Aspheres and Extended Range PSI Techniques 629\u003c\/p\u003e \u003cp\u003e14.13.1. Aliasing 630\u003c\/p\u003e \u003cp\u003e14.13.2. Sub-Nyquist Interferometry 631\u003c\/p\u003e \u003cp\u003e14.13.3. Two Wavelength PSI 635\u003c\/p\u003e \u003cp\u003e14.13.4. Subaperture Stitching 637\u003c\/p\u003e \u003cp\u003e14.14. Other Analysis Methods 638\u003c\/p\u003e \u003cp\u003e14.14.1. Zero Crossing Analysis 638\u003c\/p\u003e \u003cp\u003e14.14.2. Synchronous Detection 639\u003c\/p\u003e \u003cp\u003e14.14.3. Heterodyne Interferometry 640\u003c\/p\u003e \u003cp\u003e14.14.4. Phase Lock Interferometry 641\u003c\/p\u003e \u003cp\u003e14.14.5. Spatial Synchronous and Fourier Methods 642\u003c\/p\u003e \u003cp\u003e14.15. Computer Processing and Output 644\u003c\/p\u003e \u003cp\u003e14.16. Implementation and Applications 647\u003c\/p\u003e \u003cp\u003e14.16.1. Commercial Instrumentation 647\u003c\/p\u003e \u003cp\u003e14.16.2. Interferometer Configurations 650\u003c\/p\u003e \u003cp\u003e14.16.3. Absolute Calibration 651\u003c\/p\u003e \u003cp\u003e14.16.4. Sources 654\u003c\/p\u003e \u003cp\u003e14.16.5. Alignment Fiducials 655\u003c\/p\u003e \u003cp\u003e14.17. Future Trends for PSI 655\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 15. Surface Profilers, Multiple Wavelength, and White Light Intereferometry 667 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eJ. Schmit, K. Creath, and J. C. Wyant\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e15.1. Introduction to Surface Profilers 667\u003c\/p\u003e \u003cp\u003e15.1.1. Contact Profilometers 668\u003c\/p\u003e \u003cp\u003e15.1.2. Optical Profilometers 668\u003c\/p\u003e \u003cp\u003e15.1.3. Interferometric Optical Profilometers 668\u003c\/p\u003e \u003cp\u003e15.1.4. Terms and Issues in Determining System Performance 669\u003c\/p\u003e \u003cp\u003e15.2. Contact Profilometers 670\u003c\/p\u003e \u003cp\u003e15.2.1. Stylus Profilers 670\u003c\/p\u003e \u003cp\u003e15.2.2. Scanning Probe Microscopes 674\u003c\/p\u003e \u003cp\u003e15.2.3. Comparison of AFM and Stylus Profiler 683\u003c\/p\u003e \u003cp\u003e15.3. Optical Profilers 685\u003c\/p\u003e \u003cp\u003e15.3.1. Optical Focus Sensors 687\u003c\/p\u003e \u003cp\u003e15.3.2. Confocal Microscopy 689\u003c\/p\u003e \u003cp\u003e15.4. Interferometric Optical Profilers 695\u003c\/p\u003e \u003cp\u003e15.4.1. Common Features 696\u003c\/p\u003e \u003cp\u003e15.5. Two Wavelength and Multiple Wavelength Techniques 702\u003c\/p\u003e \u003cp\u003e15.5.1. Two-wavelengths Phase Measurement 704\u003c\/p\u003e \u003cp\u003e15.5.2. Multiple-wavelength Phase Measurement 707\u003c\/p\u003e \u003cp\u003e15.5.3. Reducing Measurement Time 710\u003c\/p\u003e \u003cp\u003e15.6. White Light Interference Optical Profilers 711\u003c\/p\u003e \u003cp\u003e15.6.1. White Light Interference 711\u003c\/p\u003e \u003cp\u003e15.6.2. Image Buildup 712\u003c\/p\u003e \u003cp\u003e15.6.3. Signal Processing of White Light Interferograms 713\u003c\/p\u003e \u003cp\u003e15.6.4. Light Sources 716\u003c\/p\u003e \u003cp\u003e15.6.5. Dispersion in White Light Fringes 716\u003c\/p\u003e \u003cp\u003e15.6.6. Other Names for Interferometric Optical Profilers 723\u003c\/p\u003e \u003cp\u003e15.7. Wavelength Scanning Interferometer 724\u003c\/p\u003e \u003cp\u003e15.7.1. Wavelength Tunable Light Sources 724\u003c\/p\u003e \u003cp\u003e15.7.2. Image Buildup 725\u003c\/p\u003e \u003cp\u003e15.7.3. Signal Analysis 728\u003c\/p\u003e \u003cp\u003e15.7.4. Film and Plate Thickness Measurement 729\u003c\/p\u003e \u003cp\u003e15.8. Spectrally Resolved White Light Interferometry (SRWLI) 731\u003c\/p\u003e \u003cp\u003e15.8.1. Image Buildup 731\u003c\/p\u003e \u003cp\u003e15.8.2. Signal Analysis 732\u003c\/p\u003e \u003cp\u003e15.8.3. Other Names for Spectral Interferometry 735\u003c\/p\u003e \u003cp\u003e15.9. Polarization Interferometers 735\u003c\/p\u003e \u003cp\u003e15.9.1. Differential Interference Contrast Microscope (Nomarski) 736\u003c\/p\u003e \u003cp\u003e15.9.2. Geometric Phase Shifting 738\u003c\/p\u003e \u003cp\u003e15.10. Optical Ranging Methods 741\u003c\/p\u003e \u003cp\u003e15.10.1. Interferometric Ranging 741\u003c\/p\u003e \u003cp\u003e15.10.2. Optical Triangulation 742\u003c\/p\u003e \u003cp\u003e15.10.3. Time of Flight (TOF) 742\u003c\/p\u003e \u003cp\u003e15.11. Summary 742\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 16. Optical Metrology of Diffuse Surfaces 756 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eK. Creath, J. Schmit, and J. C Wyant\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e16.1. Moire´ and Fringe Projection Techniques 756\u003c\/p\u003e \u003cp\u003e16.1.1. Introduction 756\u003c\/p\u003e \u003cp\u003e16.1.2. What is Moire´? 757\u003c\/p\u003e \u003cp\u003e16.1.3. Moire´ and Interferograms 762\u003c\/p\u003e \u003cp\u003e16.1.4. Historical Review 768\u003c\/p\u003e \u003cp\u003e16.1.5. Fringe Projection 769\u003c\/p\u003e \u003cp\u003e16.1.6. Shadow Moire´ 773\u003c\/p\u003e \u003cp\u003e16.1.7. Projection Moire´ 777\u003c\/p\u003e \u003cp\u003e16.1.8. Two-angle Holography 778\u003c\/p\u003e \u003cp\u003e16.1.9. Common Features 779\u003c\/p\u003e \u003cp\u003e16.1.10. Comparison to Conventional Interferometry 779\u003c\/p\u003e \u003cp\u003e16.1.11. Coded and Structured Light Projection 780\u003c\/p\u003e \u003cp\u003e16.1.12. Applications 781\u003c\/p\u003e \u003cp\u003e16.1.13. Summary 783\u003c\/p\u003e \u003cp\u003e16.2. Holographic and Speckle Tests 783\u003c\/p\u003e \u003cp\u003e16.2.1. Introduction 783\u003c\/p\u003e \u003cp\u003e16.2.2. Holographic Interferometry for Nondestructive Testing 784\u003c\/p\u003e \u003cp\u003e16.2.3. Speckle Interferometry and Digital Holography 791\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 17. Angle, Prisms, Curvature, and Focal Length Measurements 808 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eZ. Malacara\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e17.2.1. Divided Circles and Goniometers 808\u003c\/p\u003e \u003cp\u003e17.2.2. Autocollimator 810\u003c\/p\u003e \u003cp\u003e17.2.3. Interferometric Measurements of Angles 812\u003c\/p\u003e \u003cp\u003e17.3. Testing of Prisms 812\u003c\/p\u003e \u003cp\u003e17.4. Radius of Curvature Measurements 817\u003c\/p\u003e \u003cp\u003e17.4.1. Mechanical Measurement of Radius of Curvature 817\u003c\/p\u003e \u003cp\u003e17.4.2. Optical Measurement of Radius of Curvature 820\u003c\/p\u003e \u003cp\u003e17.5. Focal Length Measurements 823\u003c\/p\u003e \u003cp\u003e17.5.1. Nodal Slide Bench 823\u003c\/p\u003e \u003cp\u003e17.5.2. Focimeters 824\u003c\/p\u003e \u003cp\u003e17.5.3. Other Focal Length Measurements 825\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 18. Mathematical Representation of an Optical Surface and Its Characteristics 832 \u003cbr\u003e\u003c\/b\u003e\u003ci\u003eD. Malacara\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e18.1. Definition of an Optical Surface 832\u003c\/p\u003e \u003cp\u003e18.1.1. Parameters for Conic Surfaces 835\u003c\/p\u003e \u003cp\u003e18.1.2. Some Useful Expansions of z 835\u003c\/p\u003e \u003cp\u003e18.1.3. Aberration of the Normals to the Surface 836\u003c\/p\u003e \u003cp\u003e18.2. Caustic Produced by an Aspheric Surface 837\u003c\/p\u003e \u003cp\u003e18.3. Primary Aberrations of Spherical Surfaces 839\u003c\/p\u003e \u003cp\u003e18.3.1. Spherical Aberration of and Aspherical Surface 839\u003c\/p\u003e \u003cp\u003e18.3.2. Coma of a Concave Mirror 840\u003c\/p\u003e \u003cp\u003e18.3.3. Astigmatism of a Concave Mirror 841\u003c\/p\u003e \u003cp\u003e18.4. Astigmatic Surfaces 841\u003c\/p\u003e \u003cp\u003e18.4.1. Toroidal Surface 842\u003c\/p\u003e \u003cp\u003e18.4.2. Astigmatic Ellipsoidal and Oblate Spheroidal Surfaces 842\u003c\/p\u003e \u003cp\u003e18.4.3. Sphero-Cylindrical Surface 844\u003c\/p\u003e \u003cp\u003e18.4.4. Testing Astigmatic Surfaces and Reference Astigmatic Surface 846\u003c\/p\u003e \u003cp\u003e18.4.5. Comparison Between Astigmatic Surfaces 847\u003c\/p\u003e \u003cp\u003e18.5. Off-Axis Conicoids 849\u003c\/p\u003e \u003cp\u003e18.5.1. Off-Axis Paraboloids 850\u003c\/p\u003e \u003cp\u003eAppendix. Optical Testing Programs 852\u003c\/p\u003e \u003cp\u003eIndex 855\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-Interscience","offers":[{"title":"Brand New","offer_id":52173713965336,"sku":"9780471484042","price":144.89,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780471484042.jpg?v=1781167820","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/optical-shop-testing-hardback-9780471484042","provider":"Freshly Printed Books","version":"1.0","type":"link"}