{"product_id":"failure-mechanisms-in-semiconductor-devices-hardback-9780471954828","title":"Failure Mechanisms in Semiconductor Devices (Hardback) 9780471954828","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eFailure Mechanisms in Semiconductor Devices\u003c\/font\u003e\u003cbr\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003c\/p\u003e\n\u003cp\u003e\u003cfont size=\"4\"\u003eE. Ajith Amerasekera (Author), Farid N. Najm (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780471954828, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 20 June 1997\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e360 pages\u003cbr\u003e23.3 x 15.6 x 2.5 cm, 0.68 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eIn dieser zweiten, aktualisierten Auflage identifizieren die Autoren die Ursachen und Mechanismen, die zu Ausfällen von Halbleiterbauelementen führen. Durch Erkennungsmethoden und Technologien zur Vermeidung von Defekten, die in diesem Buch ausführlich beschrieben werden, wird die Zuverlässigkeit der Bauelemente in der Praxis entscheidend bestimmt.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eAus dem Inhalt:\u003cbr\u003e Introduction. Reliability Mathematics. Principles Failure Mechanisms. Failure Mechanisms in Technologies and Circuits. Reliability Testing. Reliability Prediction. Screening. Failure Analysis. Quality Assurance.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley","offers":[{"title":"Brand New","offer_id":52298077667608,"sku":null,"price":0.0,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780471954828.jpg?v=1781735050","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/failure-mechanisms-in-semiconductor-devices-hardback-9780471954828","provider":"Freshly Printed Books","version":"1.0","type":"link"}